Jaime BRAVO

Follow

Person

Berkeley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional pattern risk scoring
- Patent number 10,311,186
- Issue date Jun 4, 2019
- GLOBALFOUNDRIES Inc.
- Jaime Bravo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer level electrical test for optical proximity correction and/or...
- Patent number 10,078,107
- Issue date Sep 18, 2018
- GLOBALFOUNDRIES Inc.
- Jaime Bravo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL PATTERN RISK SCORING
- Publication number 20170293704
- Publication date Oct 12, 2017
- GLOBALFOUNDRIES INC.
- Jaime BRAVO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER LEVEL ELECTRICAL TEST FOR OPTICAL PROXIMITY CORRECTION AND/OR...
- Publication number 20170115337
- Publication date Apr 27, 2017
- GLOBALFOUNDRIES INC.
- Jaime BRAVO
- G01 - MEASURING TESTING