Jaime Duran

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Tucson, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Edge electrode for characterization of semiconductor wafers
- Patent number 9,442,133
- Issue date Sep 13, 2016
- Bruker Nano Inc.
- Dong Chen
- G01 - MEASURING TESTING
Information Patent Grant
Optical plate for calibration of coordinate measuring machines
- Patent number 9,372,079
- Issue date Jun 21, 2016
- Tay-Chang Wu
- G01 - MEASURING TESTING