Jais Abraham

Follow

Person

Bangalore, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Memory with scan chain testing of column redundancy logic and multi...
- Patent number 11,935,606
- Issue date Mar 19, 2024
- QUALCOMM Incorporated
- Rahul Sahu
- G11 - INFORMATION STORAGE
Information Patent Grant
Time interleaved scan system
- Patent number 10,996,267
- Issue date May 4, 2021
- QUALCOMM Incorporated
- Jais Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Low pin count test controller
- Patent number 10,656,203
- Issue date May 19, 2020
- QUALCOMM Incorporated
- Punit Kishore
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Memory with Scan Chain Testing of Column Redundancy Logic and Multi...
- Publication number 20240221853
- Publication date Jul 4, 2024
- QUALCOMM Incorporated
- Rahul SAHU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH SCAN CHAIN TESTING OF COLUMN REDUNDANCY LOGIC AND MULTI...
- Publication number 20230005556
- Publication date Jan 5, 2023
- QUALCOMM Incorporated
- Rahul SAHU
- G11 - INFORMATION STORAGE
Information Patent Application
TIME INTERLEAVED SCAN SYSTEM
- Publication number 20200233031
- Publication date Jul 23, 2020
- QUALCOMM Incorporated
- Jais ABRAHAM
- G01 - MEASURING TESTING