Jais ABRAHAM

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Malapuram, IN

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Patents Grantslast 30 patents

Information Patent Grant
Sequential scan based techniques to test interface between modules...
- Patent number 7,421,634
- Issue date Sep 2, 2008
- Texas Instruments Incorporated
- Naga Satya Srikanth Puvvada
- G01 - MEASURING TESTING
Information Patent Grant
Scan tests tolerant to indeterminate states when employing signatur...
- Patent number 7,404,126
- Issue date Jul 22, 2008
- Texas Instruments Incorporated
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Grant
Testing components of I/O paths of an integrated circuit
- Patent number 7,352,169
- Issue date Apr 1, 2008
- Texas Instruments Incorporated
- Jais Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Increasing possible test patterns which can be used with sequential...
- Patent number 7,082,558
- Issue date Jul 25, 2006
- Texas Instruments Incorporated
- Ajit D. Gupte
- G11 - INFORMATION STORAGE
Information Patent Grant
Controlling the content of specific desired memory elements when te...
- Patent number 6,981,190
- Issue date Dec 27, 2005
- Texas Instruments Incorporated
- Ajit D. Gupte
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Testing Components of I/O Paths of an Integrated Circuit
- Publication number 20080001616
- Publication date Jan 3, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Jais ABRAHAM
- G01 - MEASURING TESTING
Information Patent Application
Scan Tests Tolerant to Indeterminate States When Employing Signatur...
- Publication number 20070234150
- Publication date Oct 4, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Sandeep Jain
- G01 - MEASURING TESTING
Information Patent Application
Sequential Scan Based Techniques to Test Interface Between Modules...
- Publication number 20060248422
- Publication date Nov 2, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Naga Satya Srikanth Puvvada
- G01 - MEASURING TESTING
Information Patent Application
Increasing possible test patterns which can be used with sequential...
- Publication number 20040103352
- Publication date May 27, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Ajit D. Gupte
- G01 - MEASURING TESTING
Information Patent Application
Controlling the content of specific desired memory elements when te...
- Publication number 20040064769
- Publication date Apr 1, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Ajit D. Gupte
- G11 - INFORMATION STORAGE