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Jakob HAARSTRICH
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Jena, DE
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Patents Grants
last 30 patents
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Patent Grant
Method for determining the thickness and refractive index of a laye...
Patent number
11,371,831
Issue date
Jun 28, 2022
Carl Zeiss Microscopy GmbH
Nils Langholz
G01 - MEASURING TESTING
Information
Patent Grant
Method for generating an overview image using a large aperture obje...
Patent number
11,327,288
Issue date
May 10, 2022
Carl Zeiss Microscopy GmbH
Jakob Haarstrich
G02 - OPTICS
Information
Patent Grant
Illumination apparatus for a microscope, method for operating it, a...
Patent number
11,314,068
Issue date
Apr 26, 2022
Carl Zeiss Microscopy GmbH
Thomas Kalkbrenner
G02 - OPTICS
Information
Patent Grant
Method and arrangement for acquiring image data
Patent number
10,841,506
Issue date
Nov 17, 2020
Carl Zeiss Microscopy GmbH
Mirko Liedtke
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
DISTANCE MEASURING DEVICE AND METHOD FOR ASCERTAINING A SPATIAL ORI...
Publication number
20230384575
Publication date
Nov 30, 2023
CARL ZEISS MICROSCOPY GMBH
Christian Dietrich
G01 - MEASURING TESTING
Information
Patent Application
Method for Determining the Thickness and Refractive Index of a Layer
Publication number
20210293530
Publication date
Sep 23, 2021
CARL ZEISS MICROSCOPY GMBH
Nils LANGHOLZ
G01 - MEASURING TESTING
Information
Patent Application
Method for generating an overview image using a large aperture obje...
Publication number
20210239961
Publication date
Aug 5, 2021
CARL ZEISS MICROSCOPY GMBH
Jakob Haarstrich
G02 - OPTICS
Information
Patent Application
Illumination apparatus for a microscope, method for operating it, a...
Publication number
20200096752
Publication date
Mar 26, 2020
CARL ZEISS MICROSCOPY GMBH
Thomas Kalkbrenner
G02 - OPTICS
Information
Patent Application
Method and Arrangement for Acquiring Image Data
Publication number
20190208105
Publication date
Jul 4, 2019
CARL ZEISS MICROSCOPY GMBH
Mirko LIEDTKE
H04 - ELECTRIC COMMUNICATION TECHNIQUE