Jakub Janicki

Person

Poznan, PL

People

Patents Grantslast 30 patents

Information Patent Grant
Suspect resolution for scan chain defect diagnosis
- Patent number 11,423,202
- Issue date Aug 23, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Grzegorz Mrugalski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical failure analysis-oriented diagnosis resolution prediction
- Patent number 11,227,091
- Issue date Jan 18, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Huaxing Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reversible multi-bit scan cell-based scan chains for improving chai...
- Patent number 11,156,661
- Issue date Oct 26, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Diagnostic resolution enhancement with reversible scan chains
- Patent number 11,106,848
- Issue date Aug 31, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Wu-Tung Cheng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnosis resolution prediction
- Patent number 11,042,679
- Issue date Jun 22, 2021
- SIEMENS INDUSTRY SOFTWARE INC.
- Huaxing Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test scheduling and test access in test compression environment
- Patent number 10,955,460
- Issue date Mar 23, 2021
- Mentor Graphics Corporation
- Mark Kassab
- G01 - MEASURING TESTING
Information Patent Grant
Non-adaptive pattern reordering to improve scan chain diagnostic re...
- Patent number 10,796,043
- Issue date Oct 6, 2020
- Mentor Graphics Corporation
- Yu Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test scheduling with pattern-independent test access mechanism
- Patent number 9,088,522
- Issue date Jul 21, 2015
- Mentor Graphics Corporation
- Janusz Rajski
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS
- Publication number 20220065932
- Publication date Mar 3, 2022
- Mentor Graphics Corporation
- Grzegorz Mrugalski
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC RESOLUTION ENHANCEMENT WITH REVERSIBLE SCAN CHAINS
- Publication number 20210150111
- Publication date May 20, 2021
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Reversible Multi-Bit Scan Cell-based Scan Chains For Improving Chai...
- Publication number 20210033669
- Publication date Feb 4, 2021
- Mentor Graphics Corporation
- Wu-Tung Cheng
- G01 - MEASURING TESTING
Information Patent Application
Test Scheduling and Test Access in Test Compression Environment
- Publication number 20150285854
- Publication date Oct 8, 2015
- Mark A. Kassab
- G01 - MEASURING TESTING
Information Patent Application
Test Scheduling With Pattern-Independent Test Access Mechanism
- Publication number 20130290795
- Publication date Oct 31, 2013
- Mentor Graphics Corporation
- Janusz Rajski
- G01 - MEASURING TESTING

Jakub Janicki

Person

Patents Grantslast 30 patents

Suspect resolution for scan chain defect diagnosis

Physical failure analysis-oriented diagnosis resolution prediction

Reversible multi-bit scan cell-based scan chains for improving chai...

Diagnostic resolution enhancement with reversible scan chains

Diagnosis resolution prediction

Test scheduling and test access in test compression environment

Non-adaptive pattern reordering to improve scan chain diagnostic re...

Test scheduling with pattern-independent test access mechanism

Patents Applicationslast 30 patents

SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS

DIAGNOSTIC RESOLUTION ENHANCEMENT WITH REVERSIBLE SCAN CHAINS

Reversible Multi-Bit Scan Cell-based Scan Chains For Improving Chai...

Test Scheduling and Test Access in Test Compression Environment

Test Scheduling With Pattern-Independent Test Access Mechanism