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James A. Halamek
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Independence, OH, US
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last 30 patents
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Patent Grant
Focused point oversampling for temporally and spatially resolving d...
Patent number
6,597,936
Issue date
Jul 22, 2003
Koninklijke Philips Electronics, N.V.
Kecheng Liu
G01 - MEASURING TESTING
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Patent Grant
Time and memory optimized method of acquiring and reconstructing mu...
Patent number
6,414,487
Issue date
Jul 2, 2002
Philips Medical Systems (Cleveland), Inc.
Christopher K. Anand
G01 - MEASURING TESTING
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Patent Grant
Automatic frequency tuning for MR scanners
Patent number
5,912,558
Issue date
Jun 15, 1999
Picker International, Inc.
James A. Halamek
G01 - MEASURING TESTING
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Patent Grant
Respiratory motion compensation using segmented k-space magnetic re...
Patent number
5,766,128
Issue date
Jun 16, 1998
Picker International, Inc.
James A. Halamek
G01 - MEASURING TESTING