Providence, RI, US
Information
Patent Grant
Ametek, Inc.
James A. Salomon
G01 - MEASURING TESTING
Information
Patent Grant
Brookfield Engineering Laboratories, Inc.
Teresa L. McKim
D14 - Recording, communication, or information retrieval equipment
Information
Patent Application
AMETEK, INC.
Alex H. Mak
G01 - MEASURING TESTING
Information
Patent Application
AMETEK, INC.
Archibald Williams
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
AMETEK, INC.
Norman Kupzak
G01 - MEASURING TESTING
Information
Patent Application
AMETEK, INC.
Archibald Williams
G01 - MEASURING TESTING
Information
Patent Application
AMETEK, INC.
James A. Salomon
G01 - MEASURING TESTING
Information
Patent Application
BROOKFIELD ENGINEERING LABORATORIES, INC.
Christopher J Murray
G01 - MEASURING TESTING
Information
Patent Application
James A. Salomon
G01 - MEASURING TESTING
