James A. Smith

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for inspection using tensor decomposition and sin...
- Patent number 11,431,976
- Issue date Aug 30, 2022
- KLA Corporation
- Nurmohammed Patwary
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Print check repeater defect detection
- Patent number 11,328,411
- Issue date May 10, 2022
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 10,605,744
- Issue date Mar 31, 2020
- KLA-Tencor Corp.
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect signal to noise enhancement by reducing die to die process n...
- Patent number 10,186,028
- Issue date Jan 22, 2019
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 9,880,107
- Issue date Jan 30, 2018
- KLA-Tencor Corp.
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 8,467,047
- Issue date Jun 18, 2013
- KLA-Tencor Corp.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for detecting defects on a wafer
- Patent number 8,223,327
- Issue date Jul 17, 2012
- KLA-Tencor Corp.
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Computer-implemented methods, carrier media, and systems for stabil...
- Patent number 7,774,153
- Issue date Aug 10, 2010
- KLA-Tencor Corp.
- James A. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection using multiple sensors and parallel processing
- Patent number 7,221,992
- Issue date May 22, 2007
- KLA-Tencor Technologies Corporation
- James A. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection using multiple sensors and parallel processing
- Patent number 6,990,385
- Issue date Jan 24, 2006
- KLA-Tencor Technologies Corporation
- James A. Smith
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20240177294
- Publication date May 30, 2024
- KLA Corporation
- Nurmohammed Patwary
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20210342992
- Publication date Nov 4, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Inspection Using Tensor Decomposition and Sin...
- Publication number 20200244963
- Publication date Jul 30, 2020
- KLA Corporation
- Nurmohammed Patwary
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
- Publication number 20180202943
- Publication date Jul 19, 2018
- KLA-Tencor Corporation
- Lu Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT SIGNAL TO NOISE ENHANCEMENT BY REDUCING DIE TO DIE PROCESS N...
- Publication number 20170169552
- Publication date Jun 15, 2017
- KLA-Tencor Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Detecting Defects on a Wafer
- Publication number 20130250287
- Publication date Sep 26, 2013
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Detecting Defects on a Wafer
- Publication number 20120268735
- Publication date Oct 25, 2012
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER
- Publication number 20100188657
- Publication date Jul 29, 2010
- KLA-Tencor Corporation
- Lu Chen
- G01 - MEASURING TESTING
Information Patent Application
Defect detection using multiple sensors and parallel processing
- Publication number 20060069460
- Publication date Mar 30, 2006
- KLA-Tencor Technologies Corporation
- James A. Smith
- G06 - COMPUTING CALCULATING COUNTING

James A. Smith

Person

Patents Grantslast 30 patents

System and method for inspection using tensor decomposition and sin...

Print check repeater defect detection

Systems and methods for detecting defects on a wafer

Defect signal to noise enhancement by reducing die to die process n...

Systems and methods for detecting defects on a wafer

Systems and methods for detecting defects on a wafer

Systems and methods for detecting defects on a wafer

Computer-implemented methods, carrier media, and systems for stabil...

Defect detection using multiple sensors and parallel processing

Defect detection using multiple sensors and parallel processing

Patents Applicationslast 30 patents

PRINT CHECK REPEATER DEFECT DETECTION

PRINT CHECK REPEATER DEFECT DETECTION

System and Method for Inspection Using Tensor Decomposition and Sin...

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER

DEFECT SIGNAL TO NOISE ENHANCEMENT BY REDUCING DIE TO DIE PROCESS N...

Systems and Methods for Detecting Defects on a Wafer

Systems and Methods for Detecting Defects on a Wafer

SYSTEMS AND METHODS FOR DETECTING DEFECTS ON A WAFER

Defect detection using multiple sensors and parallel processing