James A. Wingfield

Follow

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for managing register free lists
- Patent number 11,907,070
- Issue date Feb 20, 2024
- Advanced Micro Devices, Inc.
- Eric Busta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit memory with built-in self-test (BIST)
- Patent number 11,264,115
- Issue date Mar 1, 2022
- Advanced Micro Devices, Inc.
- Russell Schreiber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit having scan warm-up
- Patent number 9,046,574
- Issue date Jun 2, 2015
- Advanced Micro Devices, Inc.
- Grady L. Giles
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING MULTI-CYCLE PATHS USING SCAN TEST
- Publication number 20240329135
- Publication date Oct 3, 2024
- ADVANCED MICRO DEVICES, INC.
- James A. Wingfield
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR MANAGING REGISTER FREE LISTS
- Publication number 20230032375
- Publication date Feb 2, 2023
- ADVANCED MICRO DEVICES, INC.
- Eric Busta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT MEMORY WITH BUILT-IN SELF-TEST (BIST)
- Publication number 20210407617
- Publication date Dec 30, 2021
- ADVANCED MICRO DEVICES, INC.
- Russell Schreiber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT HAVING SCAN WARM-UP
- Publication number 20140149813
- Publication date May 29, 2014
- Advanced Micro Devices, Inc.
- Grady L. Giles
- G01 - MEASURING TESTING