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James A. Wurzbach
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for depth profiling by temporal and spatial range...
Patent number
10,126,459
Issue date
Nov 13, 2018
Raytheon Company
James A. Wurzbach
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for non-contact inspection of containers usin...
Patent number
9,482,506
Issue date
Nov 1, 2016
Raytheon Company
James A. Wurzbach
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Methods and apparatus for using acoustic inspection of containers t...
Patent number
9,459,238
Issue date
Oct 4, 2016
Raytheon Company
Courtney Konopka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for X-ray laser interrogation
Patent number
9,440,289
Issue date
Sep 13, 2016
Raytheon Company
Kalin Spariosu
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Methods and apparatus for acoustic inspection of containers
Patent number
9,404,899
Issue date
Aug 2, 2016
Raytheon Company
Courtney Konopka
G01 - MEASURING TESTING
Information
Patent Grant
Sensor apparatus for measuring volatile organic compounds
Patent number
6,493,638
Issue date
Dec 10, 2002
Raytheon Company
Robert A. McLean
G01 - MEASURING TESTING
Information
Patent Grant
Automated network of sensor units for real-time monitoring of compo...
Patent number
5,832,411
Issue date
Nov 3, 1998
Raytheon Company
Lawrence A. Schatzmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM AND METHOD FOR DEPTH PROFILING BY TEMPORAL AND SPATIAL RANGE...
Publication number
20160266273
Publication date
Sep 15, 2016
Raytheon Company
James A. Wurzbach
G01 - MEASURING TESTING