James Annichiarico

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Hasbrouck Heights, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Rotatable display for test and measurement apparatus
- Patent number 8,981,760
- Issue date Mar 17, 2015
- Teledyne LeCroy, Inc.
- Tyler Cox
- G01 - MEASURING TESTING
Information Patent Grant
Dual tip probe
- Patent number 7,791,358
- Issue date Sep 7, 2010
- LeCroy Corporation
- James Annichiarico
- G01 - MEASURING TESTING
Information Patent Grant
Housing for test and measurement instrument
- Patent number D581821
- Issue date Dec 2, 2008
- LeCroy Corporation
- Jeremy Ems
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Housing for test and measurement instrument
- Patent number D578911
- Issue date Oct 21, 2008
- LeCroy Corporation
- Jeremy Ems
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Dual tip probe
- Patent number 7,212,018
- Issue date May 1, 2007
- LeCroy Corporation
- James Annichiarico
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Rotatable Display for Test and Measurement Apparatus
- Publication number 20110115470
- Publication date May 19, 2011
- LeCroy Corporation
- Tyler Cox
- G01 - MEASURING TESTING
Information Patent Application
Dual tip probe
- Publication number 20070164761
- Publication date Jul 19, 2007
- James Annichiarico
- G01 - MEASURING TESTING
Information Patent Application
Dual tip probe
- Publication number 20060087334
- Publication date Apr 27, 2006
- James Annichiarico
- G01 - MEASURING TESTING