James Beausang

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Instruction signature and primary input and primary output extracti...
- Patent number 6,449,755
- Issue date Sep 10, 2002
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Instructions signature and primary input and primary output extract...
- Patent number 6,141,790
- Issue date Oct 31, 2000
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Hierarchical scan architecture for design for test applications
- Patent number 6,106,568
- Issue date Aug 22, 2000
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing partial unscan and near full sc...
- Patent number 6,067,650
- Issue date May 23, 2000
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing automatic extraction and complianc...
- Patent number 6,012,155
- Issue date Jan 4, 2000
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Hierarchical scan architecture for design for test applications
- Patent number 5,949,692
- Issue date Sep 7, 1999
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Constraint driven insertion of scan logic for implementing design f...
- Patent number 5,903,466
- Issue date May 11, 1999
- Synopsys, Inc.
- James Beausang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test ready compiler for design for test synthesis
- Patent number 5,831,868
- Issue date Nov 3, 1998
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Scan segment processing within hierarchical scan architecture for d...
- Patent number 5,828,579
- Issue date Oct 27, 1998
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Test ready compiler for design for test synthesis
- Patent number 5,703,789
- Issue date Dec 30, 1997
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing partial unscan and near full sc...
- Patent number 5,696,771
- Issue date Dec 9, 1997
- Synopsys, Inc.
- James Beausang
- G01 - MEASURING TESTING

James Beausang

Person

Patents Grantslast 30 patents

Instruction signature and primary input and primary output extracti...

Instructions signature and primary input and primary output extract...

Hierarchical scan architecture for design for test applications

Method and apparatus for performing partial unscan and near full sc...

Method and system for performing automatic extraction and complianc...

Hierarchical scan architecture for design for test applications

Constraint driven insertion of scan logic for implementing design f...

Test ready compiler for design for test synthesis

Scan segment processing within hierarchical scan architecture for d...

Test ready compiler for design for test synthesis

Method and apparatus for performing partial unscan and near full sc...