TREA

James Benedict KAVANAGH

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  • Veldhoven, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    Computational wafer inspection
    • Patent number 12,067,340
    • Issue date Aug 20, 2024
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 11,080,459
    • Issue date Aug 3, 2021
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 10,579,772
    • Issue date Mar 3, 2020
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 9,990,462
    • Issue date Jun 5, 2018
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Computational wafer inspection
    • Patent number 9,507,907
    • Issue date Nov 29, 2016
    • ASML Netherlands B.V.
    • Christophe David Fouquet
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20240403537
    • Publication date Dec 5, 2024
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20210357570
    • Publication date Nov 18, 2021
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20200218849
    • Publication date Jul 9, 2020
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20170046473
    • Publication date Feb 16, 2017
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    COMPUTATIONAL WAFER INSPECTION
    • Publication number 20150356233
    • Publication date Dec 10, 2015
    • ASML NETHERLANDS B.V.
    • Christophe David FOUQUET
    • G06 - COMPUTING CALCULATING COUNTING