James Benedict KAVANAGH

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Veldhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Computational wafer inspection
- Patent number 11,080,459
- Issue date Aug 3, 2021
- ASML Netherlands B.V.
- Christophe David Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computational wafer inspection
- Patent number 10,579,772
- Issue date Mar 3, 2020
- ASML Netherlands B.V.
- Christophe David Fouquet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computational wafer inspection
- Patent number 9,990,462
- Issue date Jun 5, 2018
- ASML Netherlands B.V.
- Christophe David Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational wafer inspection
- Patent number 9,507,907
- Issue date Nov 29, 2016
- ASML Netherlands B.V.
- Christophe David Fouquet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20210357570
- Publication date Nov 18, 2021
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20200218849
- Publication date Jul 9, 2020
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20170046473
- Publication date Feb 16, 2017
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMPUTATIONAL WAFER INSPECTION
- Publication number 20150356233
- Publication date Dec 10, 2015
- ASML NETHERLANDS B.V.
- Christophe David FOUQUET
- G06 - COMPUTING CALCULATING COUNTING