James Burdorf

Person

Tualatin, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for process matching
- Patent number 6,985,847
- Issue date Jan 10, 2006
- Micron Technology, Inc.
- James Burdorf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of determining optimum exposure threshold for a given photol...
- Patent number 6,519,501
- Issue date Feb 11, 2003
- Micron Technology, Inc.
- Christophe Pierrat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for process matching
- Patent number 6,463,403
- Issue date Oct 8, 2002
- Micron Technology, Inc.
- James Burdorf
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of reducing proximity effects in lithographic processes
- Patent number 6,319,644
- Issue date Nov 20, 2001
- Micron Technology, Inc.
- Christophe Pierrat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of reducing proximity effects in lithographic processes
- Patent number 6,284,419
- Issue date Sep 4, 2001
- Micron Technology, Inc.
- Christophe Pierrat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection technique of photomask
- Patent number 6,272,236
- Issue date Aug 7, 2001
- Micron Technology, Inc.
- Christophe Pierrat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for determining optimum exposure threshold fo...
- Patent number 6,178,360
- Issue date Jan 23, 2001
- Micron Technology, Inc.
- Christophe Pierrat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of reducing proximity effects in lithographic processes
- Patent number 6,120,952
- Issue date Sep 19, 2000
- Micron Technology, Inc.
- Christophe Pierrat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection technique of photomask
- Patent number 6,091,845
- Issue date Jul 18, 2000
- Micron Technology, Inc.
- Christophe Pierrat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for multiple process parameter matching
- Patent number 6,033,814
- Issue date Mar 7, 2000
- Micron Technology, Inc.
- James Burdorf
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process for detecting defects in photomasks through aerial image co...
- Patent number 5,795,688
- Issue date Aug 18, 1998
- Micron Technology, Inc.
- James Burdorf
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Process for detecting defects in photomasks
- Publication number 20040179726
- Publication date Sep 16, 2004
- James Burdorf
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for determining optimum exposure threshold fo...
- Publication number 20030139833
- Publication date Jul 24, 2003
- Micron Technology, Inc.
- Christophe Pierrat
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
System and method for process matching
- Publication number 20030014235
- Publication date Jan 16, 2003
- Micron Technology, Inc.
- James Burdorf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
Method and apparatus for determining optimum exposure threshold for...
- Publication number 20010029403
- Publication date Oct 11, 2001
- Micron Technology, Inc.
- Christophe Pierrat
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Methods of reducing proximity effects in lithographic processes
- Publication number 20010023045
- Publication date Sep 20, 2001
- Christophe Pierrat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods of reducing proximity effects in lithographic processes
- Publication number 20010002304
- Publication date May 31, 2001
- Christophe Pierrat
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

James Burdorf

Person

Patents Grantslast 30 patents

System and method for process matching

Method of determining optimum exposure threshold for a given photol...

System and method for process matching

Methods of reducing proximity effects in lithographic processes

Methods of reducing proximity effects in lithographic processes

Inspection technique of photomask

Methods and apparatus for determining optimum exposure threshold fo...

Methods of reducing proximity effects in lithographic processes

Inspection technique of photomask

Method for multiple process parameter matching

Process for detecting defects in photomasks through aerial image co...

Patents Applicationslast 30 patents

Process for detecting defects in photomasks

Methods and apparatus for determining optimum exposure threshold fo...

System and method for process matching

Method and apparatus for determining optimum exposure threshold for...

Methods of reducing proximity effects in lithographic processes

Methods of reducing proximity effects in lithographic processes