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James C. Liu
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Santa Rosa, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Self calibration apparatus and methods
Patent number
7,652,484
Issue date
Jan 26, 2010
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Method for implementing TRL calibration in VNA
Patent number
7,124,049
Issue date
Oct 17, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Obtaining calibration parameters for a three-port device under test
Patent number
7,013,229
Issue date
Mar 14, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer mixer calibration using the unknown thru ca...
Patent number
6,995,571
Issue date
Feb 7, 2006
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
Automated electronic calibration apparatus
Patent number
6,965,241
Issue date
Nov 15, 2005
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
Electronic calibration circuit for calibrating a network analyzer
Patent number
6,914,436
Issue date
Jul 5, 2005
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial DC block
Patent number
6,798,310
Issue date
Sep 28, 2004
Agilent Technologies, Inc.
Kenneth H. Wong
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Self Calibration Apparatus And Methods
Publication number
20080204039
Publication date
Aug 28, 2008
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMPLEMENTING TRL CALIBRATION IN VNA
Publication number
20060161369
Publication date
Jul 20, 2006
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
Vector network analyzer with independently tuned receivers characte...
Publication number
20060084426
Publication date
Apr 20, 2006
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Application
Obtaining calibration parameters for a three-port device under test
Publication number
20050107972
Publication date
May 19, 2005
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
Electronic calibration circuit for calibrating a network analyzer
Publication number
20040150411
Publication date
Aug 5, 2004
James C. Liu
G01 - MEASURING TESTING
Information
Patent Application
Coaxial DC block
Publication number
20040130407
Publication date
Jul 8, 2004
Kenneth H. Wong
H01 - BASIC ELECTRIC ELEMENTS