James D. Adams

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Boulder, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for the calibration and alignment of multiple multi-axis mot...
- Patent number 6,809,823
- Issue date Oct 26, 2004
- Agilent Technologies, Inc.
- William P Kennedy
- G01 - MEASURING TESTING
Information Patent Grant
Sub-micron accuracy edge detector
- Patent number 6,765,223
- Issue date Jul 20, 2004
- Agilent Technologies, Inc.
- John Bernard Medberry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for the calibration and alignment of multiple multi-axis mot...
- Publication number 20030063277
- Publication date Apr 3, 2003
- William P. Kennedy
- G01 - MEASURING TESTING
Information Patent Application
Sub-micron accuracy edge detector
- Publication number 20030063294
- Publication date Apr 3, 2003
- John Bernard Medberry
- G01 - MEASURING TESTING