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James D. Bernstein
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Control of implant pattern critical dimensions using STI step heigh...
Patent number
8,530,247
Issue date
Sep 10, 2013
Texas Instruments Incorporated
Brian Douglas Reid
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to measure ion beam angle
Patent number
7,883,909
Issue date
Feb 8, 2011
Texas Instruments Incorporated
James David Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Divergent charged particle implantation for improved transistor sym...
Patent number
7,807,978
Issue date
Oct 5, 2010
Texas Instruments Incorporated
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Divergent charged particle implantation for improved transistor sym...
Patent number
7,385,202
Issue date
Jun 10, 2008
Texas Instruments Incorporated
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Implant optimization scheme
Patent number
7,253,072
Issue date
Aug 7, 2007
Texas Instruments Incorporated
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for implanting dopants within a substrate by tilting the sub...
Patent number
7,232,744
Issue date
Jun 19, 2007
Texas Instruments Incorporated
Said Ghneim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for varying the uniformity of a dopant as it is placed in a...
Patent number
7,208,330
Issue date
Apr 24, 2007
Texas Instruments Incorporated
Sean M. Collins
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CONTROL OF IMPLANT CRITICAL DIMENSIONS USING AN STI STEP HEIGHT BAS...
Publication number
20090170222
Publication date
Jul 2, 2009
TEXAS INSTRUMENTS INCORPORATED
Brian Douglas Reid
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIVERGENT CHARGED PARTICLE IMPLANTATION FOR IMPROVED TRANSISTOR SYM...
Publication number
20080206971
Publication date
Aug 28, 2008
TEXAS INSTRUMENTS INCORPORATED
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD TO MEASURE ION BEAM ANGLE
Publication number
20080157074
Publication date
Jul 3, 2008
James David Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Divergent Charged Particle Implantation for Improved Transistor Sym...
Publication number
20080142724
Publication date
Jun 19, 2008
TEXAS INSTRUMENTS INCORPORATED
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Implant Optimization Scheme
Publication number
20070257211
Publication date
Nov 8, 2007
TEXAS INSTRUMENTS INCORPORATED
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device having multiple source/drain extension implant...
Publication number
20070034949
Publication date
Feb 15, 2007
Texas Instruments, Incorporated
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for varying the uniformity of a dopant as it is placed in a...
Publication number
20060154457
Publication date
Jul 13, 2006
Texas Instruments, Inc.
Sean M. Collins
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Divergent charged particle implantation for improved transistor sym...
Publication number
20060121706
Publication date
Jun 8, 2006
Texas Instruments, Inc.
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for implanting dopants within a substrate by tilting the sub...
Publication number
20060073685
Publication date
Apr 6, 2006
TEXAS INSTRUMENTS INCORPORATED
Said Ghneim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Implant optimization scheme
Publication number
20050255683
Publication date
Nov 17, 2005
TEXAS INSTRUMENTS INCORPORATED
James D. Bernstein
H01 - BASIC ELECTRIC ELEMENTS