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James D. Krieger
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Cambridge, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Methods and systems for near-field microwave imaging
Patent number
11,194,038
Issue date
Dec 7, 2021
Massachusetts Institute of Technology
William F. Moulder
G01 - MEASURING TESTING
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Patent Grant
Methods and systems for near-field microwave imaging
Patent number
10,353,067
Issue date
Jul 16, 2019
Massachusetts Institute of Technology
William F. Moulder
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Methods and Systems for Near-Field Microwave Imaging
Publication number
20190324135
Publication date
Oct 24, 2019
Massachusetts Institute of Technology
William F. Moulder
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR NEAR-FIELD MICROWAVE IMAGING
Publication number
20170227636
Publication date
Aug 10, 2017
William F. Moulder
G01 - MEASURING TESTING