James E. Blessing

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Morgan Hill, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring radical particle concentration using mass spectrometry
- Patent number 12,265,057
- Issue date Apr 1, 2025
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring radical particle concentration using mass spectrometry
- Patent number 11,971,386
- Issue date Apr 30, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with gas delivery for high-fidelity analysis
- Patent number 11,768,176
- Issue date Sep 26, 2023
- MKS Instruments, Inc.
- James Edward Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust ion source
- Patent number 10,892,153
- Issue date Jan 12, 2021
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust ion source
- Patent number 10,541,122
- Issue date Jan 21, 2020
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole mass spectrometer assembly
- Patent number 6,239,429
- Issue date May 29, 2001
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20240264116
- Publication date Aug 8, 2024
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Feedback Control in Plasma Processing Using...
- Publication number 20230369033
- Publication date Nov 16, 2023
- MKS Instruments, Inc.
- Keith K. Koai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Source with Gas Delivery for High-Fidelity Analysis
- Publication number 20230213479
- Publication date Jul 6, 2023
- MKS Instruments, Inc.
- James Edward Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monitoring Radical Particle Concentration Using Mass Spectrometry
- Publication number 20220196597
- Publication date Jun 23, 2022
- MKS Instruments, Inc.
- Chenglong Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Robust Ion Source
- Publication number 20200118806
- Publication date Apr 16, 2020
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Robust Ion Source
- Publication number 20180358217
- Publication date Dec 13, 2018
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS