James E. Boyette Jr.

Person

Delray Beach, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing circuits having different configur...
- Patent number 6,252,414
- Issue date Jun 26, 2001
- International Business Machines Corporation
- James Edward Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe replacement in a scanning probe microscope
- Patent number 6,093,930
- Issue date Jul 25, 2000
- International Business Machnines Corporation
- James Edward Boyette
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for testing flexible circuit substrates
- Patent number 6,034,524
- Issue date Mar 7, 2000
- International Business Machines Corporation
- Wayne Albert Barringer
- G01 - MEASURING TESTING
Information Patent Grant
Dual-contact probe tip for flying probe tester
- Patent number 6,023,171
- Issue date Feb 8, 2000
- International Business Machines Corporation
- James Edward Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Height stage for positioning apparatus
- Patent number 5,757,159
- Issue date May 26, 1998
- International Business Machines Corporation
- James Edward Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,635,849
- Issue date Jun 3, 1997
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Breakaway test probe actuator used in a probing apparatus
- Patent number 5,598,104
- Issue date Jan 28, 1997
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
High speed test probe positioning system
- Patent number 5,550,483
- Issue date Aug 27, 1996
- International Business Machines
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Open frame gantry probing system
- Patent number 5,543,726
- Issue date Aug 6, 1996
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,532,611
- Issue date Jul 2, 1996
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Testing fixture and method for circuit traces on a flexible substrate
- Patent number 5,467,020
- Issue date Nov 14, 1995
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Split-fixture configuration and method for testing circuit traces o...
- Patent number 5,461,324
- Issue date Oct 24, 1995
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING

James E. Boyette Jr.

Person

Patents Grantslast 30 patents

Method and apparatus for testing circuits having different configur...

Automatic probe replacement in a scanning probe microscope

Apparatus and method for testing flexible circuit substrates

Dual-contact probe tip for flying probe tester

Height stage for positioning apparatus

Miniature probe positioning actuator

Breakaway test probe actuator used in a probing apparatus

High speed test probe positioning system

Open frame gantry probing system

Miniature probe positioning actuator

Testing fixture and method for circuit traces on a flexible substrate

Split-fixture configuration and method for testing circuit traces o...