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James E. Healy JR.
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Carnegie, PA, US
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last 30 patents
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Patent Application
Method and apparatus for removing and/or preventing surface contami...
Publication number
20050241175
Publication date
Nov 3, 2005
Solid State Measurements, Inc.
William H. Howland
B08 - CLEANING
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Patent Application
Method of testing semiconductor wafers with non-penetrating probes
Publication number
20050225345
Publication date
Oct 13, 2005
Solid State Measurements, Inc.
Robert G. Mazur
G01 - MEASURING TESTING
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Patent Application
Semiconductor substrate surface preparation using high temperature...
Publication number
20050028836
Publication date
Feb 10, 2005
Solid State Measurements, Inc.
Michael J. Adams
H01 - BASIC ELECTRIC ELEMENTS