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James E. Hudson
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods and systems for characterizing photovoltaic cell and module...
Patent number
9,537,444
Issue date
Jan 3, 2017
Tau Science Corporation
John M. Schmidt
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
9,349,570
Issue date
May 24, 2016
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
8,993,962
Issue date
Mar 31, 2015
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
8,357,913
Issue date
Jan 22, 2013
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
High speed quantum efficiency measurement apparatus utilizing solid...
Patent number
8,299,416
Issue date
Oct 30, 2012
Tau Science Corporation
Mark A. Arbore
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
High speed detection of shunt defects in photovoltaic and optoelect...
Patent number
8,278,937
Issue date
Oct 2, 2012
Tau Science Corporation
Leonid A. Vasilyev
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Defect analyzer
Patent number
8,249,828
Issue date
Aug 21, 2012
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defect analyzer
Patent number
7,987,072
Issue date
Jul 26, 2011
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defect analyzer
Patent number
7,474,986
Issue date
Jan 6, 2009
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Defect analyzer
Patent number
7,103,505
Issue date
Sep 5, 2006
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and Apparatus for Sample Extraction and Handling
Publication number
20150311034
Publication date
Oct 29, 2015
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
Methods and Systems for Characterizing Photovoltaic Cell and Module...
Publication number
20150084664
Publication date
Mar 26, 2015
John M. Schmidt
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
Publication number
20130153785
Publication date
Jun 20, 2013
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
DEFECT ANALYZER
Publication number
20110251713
Publication date
Oct 13, 2011
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
Publication number
20100305747
Publication date
Dec 2, 2010
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
High speed quantum efficiency measurement apparatus utilizing solid...
Publication number
20100219327
Publication date
Sep 2, 2010
Mark A. Arbore
G01 - MEASURING TESTING
Information
Patent Application
High speed detection of shunt defects in photovoltaic and optoelect...
Publication number
20100201374
Publication date
Aug 12, 2010
Leonid A. Vasilyev
G01 - MEASURING TESTING
Information
Patent Application
DEFECT ANALYZER
Publication number
20090230303
Publication date
Sep 17, 2009
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Defect analyzer
Publication number
20070067131
Publication date
Mar 22, 2007
FEI Company
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Defect analyzer
Publication number
20040158409
Publication date
Aug 12, 2004
Janet Teshima
H01 - BASIC ELECTRIC ELEMENTS