James E. Klekotka

Person

Mesa, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for using an optically tunable soft mask to c...
- Patent number 7,555,395
- Issue date Jun 30, 2009
- Tokyo Electron Limited
- James E. Willis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for data pre-population
- Patent number 7,437,199
- Issue date Oct 14, 2008
- Tokyo Electron Limited
- James E Willis
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Creating an optically tunable anti-reflective coating
- Patent number 7,300,730
- Issue date Nov 27, 2007
- Tokyo Electron Limited
- James E. Willis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for monitoring parts in a material processing...
- Patent number 6,985,787
- Issue date Jan 10, 2006
- Tokyo Electron Limited
- James E. Klekotka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring a material processing system
- Patent number 6,898,558
- Issue date May 24, 2005
- Tokyo Electron Limited
- James E. Klekotka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Technique for satellite constellation growth
- Patent number 6,491,257
- Issue date Dec 10, 2002
- Motorola, Inc.
- Thomas Peter Emmons
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
High speed programmable frequency divider and PLL
- Patent number 4,856,032
- Issue date Aug 8, 1989
- Motorola, Inc.
- James E. Klekotka
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
System and Method For Removing Post-Etch Residue
- Publication number 20090211603
- Publication date Aug 27, 2009
- TOKYO ELECTRON LIMITED
- Thomas Winter
- B08 - CLEANING
Information Patent Application
System and Method For Removing Edge-Bead Material
- Publication number 20090211604
- Publication date Aug 27, 2009
- TOKYO ELECTRON LIMITED
- Thomas Winter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCURACY OF OPTICAL METROLOGY MEASUREMENTS
- Publication number 20080076046
- Publication date Mar 27, 2008
- TOKYO ELECTRON LIMITED
- James E. Willis
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR USING AN OPTICALLY TUNABLE SOFT MASK PROF...
- Publication number 20080077352
- Publication date Mar 27, 2008
- TOKYO ELECTRON LIMITED
- James E. Willis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR USING AN OPTICALLY TUNABLE SOFT MASK TO C...
- Publication number 20080077362
- Publication date Mar 27, 2008
- TOKYO ELECTRON LIMITED
- James E. Willis
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ACCURACY OF OPTICAL METROLOGY MEASUREMENTS
- Publication number 20080074677
- Publication date Mar 27, 2008
- TOKYO ELECTRON LIMITED
- James E. Willis
- G01 - MEASURING TESTING
Information Patent Application
ACCURACY OF OPTICAL METROLOGY MEASUREMENTS
- Publication number 20080074678
- Publication date Mar 27, 2008
- TOKYO ELECTRON LIMITED
- James E. Willis
- G01 - MEASURING TESTING
Information Patent Application
Method for data pre-population
- Publication number 20040243256
- Publication date Dec 2, 2004
- TOKYO ELECTRON LIMITED
- James E. Willis
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for monitoring a material processing system
- Publication number 20040127030
- Publication date Jul 1, 2004
- TOKYO ELECTRON LIMITED
- James E. Klekotka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for monitoring a plasma in a material processi...
- Publication number 20040127031
- Publication date Jul 1, 2004
- TOKYO ELECTRON LIMITED
- James E. Klekotka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for monitoring a material processing system
- Publication number 20040128021
- Publication date Jul 1, 2004
- TOKYO ELECTRON LIMITED
- James E. Klekotka
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for monitoring parts in a plasma in a material...
- Publication number 20040128014
- Publication date Jul 1, 2004
- TOKYO ELECTRON LIMITED
- James E. Klekotka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for monitoring a material processing system
- Publication number 20040126906
- Publication date Jul 1, 2004
- TOKYO ELECTRON LIMITED
- James E. Klekotka
- H01 - BASIC ELECTRIC ELEMENTS

James E. Klekotka

Person

Patents Grantslast 30 patents

Methods and apparatus for using an optically tunable soft mask to c...

Method for data pre-population

Creating an optically tunable anti-reflective coating

Method and apparatus for monitoring parts in a material processing...

Method and apparatus for monitoring a material processing system

Technique for satellite constellation growth

High speed programmable frequency divider and PLL

Patents Applicationslast 30 patents

System and Method For Removing Post-Etch Residue

System and Method For Removing Edge-Bead Material

ACCURACY OF OPTICAL METROLOGY MEASUREMENTS

METHODS AND APPARATUS FOR USING AN OPTICALLY TUNABLE SOFT MASK PROF...

METHODS AND APPARATUS FOR USING AN OPTICALLY TUNABLE SOFT MASK TO C...

ACCURACY OF OPTICAL METROLOGY MEASUREMENTS

ACCURACY OF OPTICAL METROLOGY MEASUREMENTS

Method for data pre-population

Method and apparatus for monitoring a material processing system

Method and apparatus for monitoring a plasma in a material processi...

Method and apparatus for monitoring a material processing system

Method and apparatus for monitoring parts in a plasma in a material...

Method and apparatus for monitoring a material processing system