James E. Mason

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for calibrating optical measurement systems that...
- Patent number 8,526,005
- Issue date Sep 3, 2013
- Lockheed Martin Corporation
- James E. Mason
- G01 - MEASURING TESTING
Information Patent Grant
Tunable Michelson and Mach-Zehnder interferometers modified with Gi...
- Patent number 7,952,807
- Issue date May 31, 2011
- Lockheed Martin Corporation
- Christopher W. Tischhauser
- G01 - MEASURING TESTING
Information Patent Grant
Tunable Michelson and Mach-Zehnder interferometers modified with Gi...
- Patent number 7,880,968
- Issue date Feb 1, 2011
- Lockheed Martin Corporation
- Christopher W. Tischhauser
- G01 - MEASURING TESTING
Information Patent Grant
Tunable Michelson and Mach-Zehnder interferometers modified with Gi...
- Patent number 7,679,755
- Issue date Mar 16, 2010
- Lockheed Martin Corporation
- Christopher W. Tischhauser
- G01 - MEASURING TESTING
Information Patent Grant
Tunable Michelson and Mach-Zehnder interferometers modified with Gi...
- Patent number 7,433,054
- Issue date Oct 7, 2008
- Lockheed Martin Corporation
- Christopher W. Tischhauser
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TUNABLE MICHELSON AND MACH-ZEHNDER INTERFEROMETERS MODIFIED WITH GI...
- Publication number 20110090567
- Publication date Apr 21, 2011
- Lockheed Martin Corporation
- Christopher W. Tischhauser
- G01 - MEASURING TESTING