James E. Nulty

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of fabricating a probe card
- Patent number 7,685,705
- Issue date Mar 30, 2010
- Cypress Semiconductor Corporation
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method for constructing same
- Patent number 7,332,921
- Issue date Feb 19, 2008
- Cypress Semiconductor Corporation
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Grant
Advanced probe card and method of fabricating same
- Patent number 7,112,975
- Issue date Sep 26, 2006
- Cypress Semiconductor Corporation
- Bo Jin
- G01 - MEASURING TESTING
Information Patent Grant
Method for etching and/or patterning a silicon-containing layer
- Patent number 6,890,860
- Issue date May 10, 2005
- Cypress Semiconductor Corporation
- Tinghao F. Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card with an adapter layer for testing integrated circuits
- Patent number 6,847,218
- Issue date Jan 25, 2005
- Cypress Semiconductor Corporation
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Grant
Structure having reduced lateral spacer erosion
- Patent number 6,784,552
- Issue date Aug 31, 2004
- Cypress Semiconductor Corporation
- James E. Nulty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma etching method
- Patent number 6,406,640
- Issue date Jun 18, 2002
- Cypress Semiconductor Corporation
- Chan-lon Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective SAC etch process
- Patent number 6,403,488
- Issue date Jun 11, 2002
- Cypress Semiconductor Corp.
- Chan-Lon Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ELECTROSTATIC OR MECHANICAL CHUCK ASSEMBLY CONFERRING IMPROVED TEMP...
- Patent number 6,373,679
- Issue date Apr 16, 2002
- Cypress Semiconductor Corp.
- Jianmin Qiao
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Plasma etch chemistry and method of improving etch control
- Patent number 6,372,634
- Issue date Apr 16, 2002
- Cypress Semiconductor Corp.
- Jianmin Qiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for making self-aligned contacts
- Patent number 6,214,743
- Issue date Apr 10, 2001
- Cypress Semiconductor Corporation
- Jianmin Oiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma etching method
- Patent number 6,165,375
- Issue date Dec 26, 2000
- Cypress Semiconductor Corporation
- Chan-lon Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for eliminating lateral spacer erosion on enclosed contact t...
- Patent number 6,066,555
- Issue date May 23, 2000
- Cypress Semiconductor Corporation
- James E. Nulty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of etching an oxide layer
- Patent number 5,562,801
- Issue date Oct 8, 1996
- Cypress Semiconductor Corporation
- James E. Nulty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of etching an oxide layer
- Patent number 5,468,342
- Issue date Nov 21, 1995
- Cypress Semiconductor Corp.
- James E. Nulty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a stable plasma
- Patent number 5,441,596
- Issue date Aug 15, 1995
- Cypress Semiconductor Corporation
- James E. Nulty
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for end point detection
- Patent number 5,045,149
- Issue date Sep 3, 1991
- VLSI Technology, Inc.
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Grant
Dry etch process for forming champagne profiles, and dry etch appar...
- Patent number 5,013,400
- Issue date May 7, 1991
- General Signal Corporation
- Howard S. Kurasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Endpoint detection system and method for plasma etching
- Patent number 4,954,212
- Issue date Sep 4, 1990
- VLSI Technology, Inc.
- Calvin T. Gabriel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Probe card and method for constructing same
- Publication number 20080110019
- Publication date May 15, 2008
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Application
Probe card and method for constructing same
- Publication number 20050212540
- Publication date Sep 29, 2005
- Cypress Semiconductor Corporation
- James E. Nulty
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE HAVING REDUCED LATERAL SPACER EROSION
- Publication number 20020146897
- Publication date Oct 10, 2002
- James E. Nulty
- H01 - BASIC ELECTRIC ELEMENTS

James E. Nulty

Person

Patents Grantslast 30 patents

Method of fabricating a probe card

Probe card and method for constructing same

Advanced probe card and method of fabricating same

Method for etching and/or patterning a silicon-containing layer

Probe card with an adapter layer for testing integrated circuits

Structure having reduced lateral spacer erosion

Plasma etching method

Selective SAC etch process

ELECTROSTATIC OR MECHANICAL CHUCK ASSEMBLY CONFERRING IMPROVED TEMP...

Plasma etch chemistry and method of improving etch control

Method and structure for making self-aligned contacts

Plasma etching method

Method for eliminating lateral spacer erosion on enclosed contact t...

Method of etching an oxide layer

Method of etching an oxide layer

Method for forming a stable plasma

Method and apparatus for end point detection

Dry etch process for forming champagne profiles, and dry etch appar...

Endpoint detection system and method for plasma etching

Patents Applicationslast 30 patents

Probe card and method for constructing same

Probe card and method for constructing same

STRUCTURE HAVING REDUCED LATERAL SPACER EROSION