James E. SPINAR

Person

Clackamas, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe tip and probe assembly
- Patent number 10,241,133
- Issue date Mar 26, 2019
- Tektronix, Inc.
- Julie A. Campbell
- G05 - CONTROLLING REGULATING
Information Patent Grant
High impedance compliant probe tip
- Patent number 10,119,992
- Issue date Nov 6, 2018
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Grant
Dual probing tip system
- Patent number 8,860,449
- Issue date Oct 14, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING
Information Patent Grant
Modular probe assembly having force protection and articulation
- Patent number 8,826,754
- Issue date Sep 9, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING
Information Patent Grant
Probing tip for a signal acquisition probe
- Patent number 8,643,396
- Issue date Feb 4, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing probe with printed tip
- Patent number 8,091,225
- Issue date Jan 10, 2012
- Tektronix, Inc.
- Leonard A. Roland
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe with printed tip
- Patent number 7,940,067
- Issue date May 10, 2011
- Tektronix, Inc.
- Leonard A. Roland
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for probe tip contact
- Patent number 7,161,366
- Issue date Jan 9, 2007
- Tektronix, Inc.
- Geoffrey Herrick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE TIP AND PROBE ASSEMBLY
- Publication number 20180059139
- Publication date Mar 1, 2018
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Application
HIGH IMPEDANCE COMPLIANT PROBE TIP
- Publication number 20160291054
- Publication date Oct 6, 2016
- Tektronix, Inc.
- William A. Hagerup
- G01 - MEASURING TESTING
Information Patent Application
Modular Probe Assembly Having Force Protection and Articulation
- Publication number 20140053667
- Publication date Feb 27, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING
Information Patent Application
Dual Probing Tip System
- Publication number 20120313658
- Publication date Dec 13, 2012
- Tektronix, Inc.
- JAMES E. SPINAR
- G01 - MEASURING TESTING
Information Patent Application
PROBING TIP FOR A SIGNAL ACQUISITION PROBE
- Publication number 20120306522
- Publication date Dec 6, 2012
- Tektronix, Inc.
- James E. SPINAR
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH PRINTED TIP
- Publication number 20110121849
- Publication date May 26, 2011
- Tektronix, Inc.
- Leonard A. ROLAND
- G01 - MEASURING TESTING
Information Patent Application
PROBE WITH PRINTED TIP
- Publication number 20100060304
- Publication date Mar 11, 2010
- Tektronix, Inc.
- Leonard A. ROLAND
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for probe tip contact
- Publication number 20060103400
- Publication date May 18, 2006
- Geoffrey Herrick
- G01 - MEASURING TESTING

James E. SPINAR

Person

Patents Grantslast 30 patents

Probe tip and probe assembly

High impedance compliant probe tip

Dual probing tip system

Modular probe assembly having force protection and articulation

Probing tip for a signal acquisition probe

Method of manufacturing probe with printed tip

Probe with printed tip

Method and apparatus for probe tip contact

Patents Applicationslast 30 patents

PROBE TIP AND PROBE ASSEMBLY

HIGH IMPEDANCE COMPLIANT PROBE TIP

Modular Probe Assembly Having Force Protection and Articulation

Dual Probing Tip System

PROBING TIP FOR A SIGNAL ACQUISITION PROBE

PROBE WITH PRINTED TIP

PROBE WITH PRINTED TIP

Method and apparatus for probe tip contact