James F. Biegen

Person

Middletown, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Equal-path interferometer
- Patent number 8,045,175
- Issue date Oct 25, 2011
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interference objective for annular test surfaces
- Patent number 7,751,064
- Issue date Jul 6, 2010
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Optical systems for measuring form and geometric dimensions of prec...
- Patent number 6,822,745
- Issue date Nov 23, 2004
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Calibration standard for optical gap measuring tools
- Patent number 5,724,134
- Issue date Mar 3, 1998
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric method and apparatus to measure surface topography
- Patent number 5,390,023
- Issue date Feb 14, 1995
- Zygo Corporation
- James F. Biegen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric surface profiler for spherical surfaces
- Patent number 4,948,253
- Issue date Aug 14, 1990
- Zygo Corporation
- James F. Biegen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric surface profiler
- Patent number 4,869,593
- Issue date Sep 26, 1989
- Zygo Corporation
- James F. Biegen
- G01 - MEASURING TESTING
Information Patent Grant
Coating and method for testing plano and spherical wavefront produc...
- Patent number 4,820,049
- Issue date Apr 11, 1989
- Zygo Corporation
- James F. Biegen
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric surface profiler
- Patent number 4,732,483
- Issue date Mar 22, 1988
- Zygo Corporation
- James F. Biegen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Equal-Path Interferometer
- Publication number 20110007323
- Publication date Jan 13, 2011
- Zygo Corporation
- Peter J. De Groot
- G02 - OPTICS
Information Patent Application
INTERFERENCE OBJECTIVE FOR ANNULAR TEST SURFACES
- Publication number 20090185195
- Publication date Jul 23, 2009
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Application
Optical systems for measuring form and geometric dimensions of prec...
- Publication number 20010043333
- Publication date Nov 22, 2001
- Peter De Groot
- G01 - MEASURING TESTING

James F. Biegen

Person

Patents Grantslast 30 patents

Equal-path interferometer

Interference objective for annular test surfaces

Optical systems for measuring form and geometric dimensions of prec...

Calibration standard for optical gap measuring tools

Interferometric method and apparatus to measure surface topography

Interferometric surface profiler for spherical surfaces

Interferometric surface profiler

Coating and method for testing plano and spherical wavefront produc...

Interferometric surface profiler

Patents Applicationslast 30 patents

Equal-Path Interferometer

INTERFERENCE OBJECTIVE FOR ANNULAR TEST SURFACES

Optical systems for measuring form and geometric dimensions of prec...