James F. Plusquellic

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Owing Mills, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring device mismatches
- Patent number 7,622,942
- Issue date Nov 24, 2009
- International Business Machines Corporation
- Kanak B. Agarwal
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for measuring device mismatches
- Patent number 7,408,372
- Issue date Aug 5, 2008
- International Business Machines Corporation
- Kanak B. Agarwal
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MEASURING DEVICE MISMATCHES
- Publication number 20080258752
- Publication date Oct 23, 2008
- Kanak B. Agarwal
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measuring Device Mismatches
- Publication number 20070296442
- Publication date Dec 27, 2007
- Kanak B. Agarwal
- G01 - MEASURING TESTING