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James Fahey Jr.
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Aix En Provence, FR
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last 30 patents
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Patent Grant
Boundary scan method for terminating or modifying integrated circui...
Patent number
6,158,034
Issue date
Dec 5, 2000
Atmel Corporation
Srinivas Ramamurthy
G01 - MEASURING TESTING
Information
Patent Grant
Boundary scan system with address dependent instructions
Patent number
6,032,279
Issue date
Feb 29, 2000
Atmel Corporation
Srinivas Ramamurthy
G01 - MEASURING TESTING
Information
Patent Grant
Configuration control in a programmable logic device using non-vola...
Patent number
5,968,196
Issue date
Oct 19, 1999
Atmel Corporation
Srinivas Ramamurthy
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit with flag register for block selection of nonvol...
Patent number
5,848,026
Issue date
Dec 8, 1998
Atmel Corporation
Srinivas Ramamurthy
G11 - INFORMATION STORAGE