James Garcia

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Austin, TX, US

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Patents Grantslast 30 patents

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Apparatus for measuring contaminant mobile ions in dielectric mater...
- Patent number 6,699,436
- Issue date Mar 2, 2004
- Advanced Micro Devices, Inc.
- James Garcia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for measuring contaminant mobile ions in dielectric materials
- Patent number 6,420,893
- Issue date Jul 16, 2002
- Advanced Micro Devices, Inc.
- James Garcia
- H01 - BASIC ELECTRIC ELEMENTS