James H. WALSH

Person

Newtown, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus for and method cleaning a support inside a lithography ap...
- Patent number 11,480,885
- Issue date Oct 25, 2022
- ASML Holding N.V.
- James Hamilton Walsh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus including a gas gauge and method of operating the same
- Patent number 10,429,748
- Issue date Oct 1, 2019
- ASML Holding N.V.
- Joseph Harry Lyons
- G01 - MEASURING TESTING
Information Patent Grant
Compact two-sided reticle inspection system
- Patent number 10,156,527
- Issue date Dec 18, 2018
- ASML Holding N.V.
- Stanley G. Janik
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical system, inspection system and manufacturing method
- Patent number 9,411,244
- Issue date Aug 9, 2016
- ASML Holding N.V.
- Lev Ryzhikov
- G01 - MEASURING TESTING
Information Patent Grant
Optical system, inspection system and manufacturing method
- Patent number 8,692,977
- Issue date Apr 8, 2014
- ASML Holding N.V.
- Lev Ryzhikov
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection on an object surface
- Patent number 8,634,054
- Issue date Jan 21, 2014
- ASML Holding N.V.
- Yuli Vladimirsky
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 7,549,321
- Issue date Jun 23, 2009
- ASML Holding N.V.
- Peter C. Kochersperger
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor
- Patent number 7,472,580
- Issue date Jan 6, 2009
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS...
- Publication number 20230142459
- Publication date May 11, 2023
- ASML Holding N.V.
- Andrew JUDGE
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED ALIGNMENT OF SCATTEROMETER BASED PARTICLE INSPECTION SYSTEM
- Publication number 20230089666
- Publication date Mar 23, 2023
- ASML Holding N.V.
- Christopher Michael DOHAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REGION OF INTEREST PROCESSING FOR RETICLE PARTICLE DETEC...
- Publication number 20230055116
- Publication date Feb 23, 2023
- ASML Holding N.V.
- Peter Conrad KOCHERSPERGER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS FOR AND METHOD CLEANING A SUPPORT INSIDE A LITHOGRAPHY AP...
- Publication number 20220004112
- Publication date Jan 6, 2022
- ASML Holding N.V.
- James Hamilton WALSH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AN APPARATUS INCLUDING A GAS GAUGE AND METHOD OF OPERATING THE SAME
- Publication number 20180157181
- Publication date Jun 7, 2018
- ASML Holding N.V.
- Joseph Harry LYONS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Compact Two-Sided Reticle Inspection System
- Publication number 20170212057
- Publication date Jul 27, 2017
- ASML Holding N.V.
- Stanley G. JANIK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM, INSPECTION SYSTEM AND MANUFACTURING METHOD
- Publication number 20140098356
- Publication date Apr 10, 2014
- ASML Holding N.V.
- Lev RYZHIKOV
- G02 - OPTICS
Information Patent Application
Surface Inspection System with Advanced Illumination
- Publication number 20120086800
- Publication date Apr 12, 2012
- ASML Holding N.V.
- Yuli VLADIMIRSKY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Apparatus Employing Wide Angle Objective Lens With Optic...
- Publication number 20110317136
- Publication date Dec 29, 2011
- ASML NETHERLANDS B.V.
- Lev Ryzhikov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL SYSTEM, INSPECTION SYSTEM AND MANUFACTURING METHOD
- Publication number 20110279805
- Publication date Nov 17, 2011
- ASML Holding N.V.
- Lev Ryzhikov
- G02 - OPTICS
Information Patent Application
Particle Detection on an Object Surface
- Publication number 20100045955
- Publication date Feb 25, 2010
- ASML Holding N.V.
- Yuli VLADIMIRSKY
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20070186621
- Publication date Aug 16, 2007
- ASML Holding N.V.
- Peter C. Kochersperger
- G01 - MEASURING TESTING
Information Patent Application
Pressure sensor
- Publication number 20070176121
- Publication date Aug 2, 2007
- ASML Holding N.V.
- Joseph H. Lyons
- G01 - MEASURING TESTING

James H. WALSH

Person

Patents Grantslast 30 patents

Apparatus for and method cleaning a support inside a lithography ap...

Apparatus including a gas gauge and method of operating the same

Compact two-sided reticle inspection system

Optical system, inspection system and manufacturing method

Optical system, inspection system and manufacturing method

Particle detection on an object surface

Pressure sensor

Pressure sensor

Patents Applicationslast 30 patents

CONTAMINANT IDENTIFICATION METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS...

IMPROVED ALIGNMENT OF SCATTEROMETER BASED PARTICLE INSPECTION SYSTEM

METHOD FOR REGION OF INTEREST PROCESSING FOR RETICLE PARTICLE DETEC...

APPARATUS FOR AND METHOD CLEANING A SUPPORT INSIDE A LITHOGRAPHY AP...

AN APPARATUS INCLUDING A GAS GAUGE AND METHOD OF OPERATING THE SAME

Compact Two-Sided Reticle Inspection System

OPTICAL SYSTEM, INSPECTION SYSTEM AND MANUFACTURING METHOD

Surface Inspection System with Advanced Illumination

Inspection Apparatus Employing Wide Angle Objective Lens With Optic...

OPTICAL SYSTEM, INSPECTION SYSTEM AND MANUFACTURING METHOD

Particle Detection on an Object Surface

Pressure sensor

Pressure sensor