James Hendrix

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Livermore, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Broadband wavelength selective filter
- Patent number 7,304,735
- Issue date Dec 4, 2007
- KLA Tencor Technologies
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Beam splitter/combiner for optical metrology tool
- Patent number 7,251,036
- Issue date Jul 31, 2007
- Therma-Wave, Inc.
- James Hendrix
- G01 - MEASURING TESTING
Information Patent Grant
Flat spectrum illumination source for optical metrology
- Patent number 7,154,607
- Issue date Dec 26, 2006
- Therma-Wave, Inc.
- James Lee Hendrix
- G01 - MEASURING TESTING
Information Patent Grant
Beam splitter/combiner for optical meterology tool
- Patent number 7,027,158
- Issue date Apr 11, 2006
- Therma-Wave, Inc.
- James Hendrix
- G01 - MEASURING TESTING
Information Patent Grant
Integrated optical switch/amplifier with modulation capabilities
- Patent number 6,574,381
- Issue date Jun 3, 2003
- Robert Stoddard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarization selecting optical element using a porro prism incorpor...
- Patent number 6,229,645
- Issue date May 8, 2001
- The United States of America as represented by the United States Department o...
- James Lee Hendrix
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Techniques for reducing optical noise in metrology systems
- Publication number 20070121104
- Publication date May 31, 2007
- James L. Hendrix
- G02 - OPTICS
Information Patent Application
Beam splitter/combiner for optical metrology tool
- Publication number 20060126071
- Publication date Jun 15, 2006
- Therma-Wave, Inc. (ARO)
- James Hendrix
- G01 - MEASURING TESTING
Information Patent Application
Broadband wavelength selective filter
- Publication number 20050270524
- Publication date Dec 8, 2005
- David Y. Wang
- G01 - MEASURING TESTING
Information Patent Application
Flat spectrum illumination source for optical metrology
- Publication number 20040150828
- Publication date Aug 5, 2004
- James Lee Hendrix
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic ellipsometer wafer mapper for DUV to IR
- Publication number 20040135995
- Publication date Jul 15, 2004
- James Lee Hendrix
- G01 - MEASURING TESTING
Information Patent Application
Beam splitter/combiner for optical meterology tool
- Publication number 20030169425
- Publication date Sep 11, 2003
- James Hendrix
- G01 - MEASURING TESTING
Information Patent Application
Integrated optical switch/amplifier with modulation cpabilities
- Publication number 20030039425
- Publication date Feb 27, 2003
- Robert Stoddard
- G02 - OPTICS