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James H.G. Owen
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Garland, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Depassivation lithography by scanning tunneling microscopy
Patent number
10,983,142
Issue date
Apr 20, 2021
Zyvex Labs, LLC
John Randall
G01 - MEASURING TESTING
Information
Patent Grant
Methods, devices and systems for scanning tunneling microscopy cont...
Patent number
10,495,665
Issue date
Dec 3, 2019
Zyvex Labs, LLC
Seyed Omid Reza Moheimani
G01 - MEASURING TESTING
Information
Patent Grant
Methods, devices, and systems for forming atomically precise struct...
Patent number
9,329,201
Issue date
May 3, 2016
Zyvex Labs LLC
John Neal Randall
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
SURFACE CONTAMINANT REDUCTION IN CONTROLLED ENVIRONMENTS
Publication number
20200176248
Publication date
Jun 4, 2020
ZYVEX LABS, LLC
JAMES OWEN
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
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Patent Application
Depassivation Lithography by Scanning Tunneling Microscopy
Publication number
20200132718
Publication date
Apr 30, 2020
ZYVEX LABS, LLC
John Randall
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS, DEVICES AND SYSTEMS FOR SCANNING TUNNELING MICROSCOPY CONT...
Publication number
20180100875
Publication date
Apr 12, 2018
ZYVEX LABS, LLC
Seyed Omid Reza Moheimani
G01 - MEASURING TESTING
Information
Patent Application
Methods, Devices, and Systems for Forming Atomically Precise Struct...
Publication number
20150355226
Publication date
Dec 10, 2015
ZYVEX LABS, LLC
John Neal Randall
G01 - MEASURING TESTING