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James Hoffman
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for substrate transfer in a thermal treatment...
Patent number
10,460,922
Issue date
Oct 29, 2019
Applied Materials, Inc.
James Hoffman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for handling substrates in a processing system...
Patent number
10,043,693
Issue date
Aug 7, 2018
Applied Materials, Inc.
Jaeyoung Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dynamic routing control methods and systems for a cluster tool
Patent number
9,008,833
Issue date
Apr 14, 2015
Applied Materials, Inc.
James Hoffman
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Detecting plasma chamber malfunction
Patent number
8,674,844
Issue date
Mar 18, 2014
Applied Materials, Inc.
Beom Soo Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flexible process condition monitoring
Patent number
8,670,857
Issue date
Mar 11, 2014
Applied Materials, Inc.
Hong Soon Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Frequency monitoring to detect plasma process abnormality
Patent number
8,174,400
Issue date
May 8, 2012
Applied Materials, Inc.
Beom Soo Park
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency monitoring to detect plasma process abnormality
Patent number
7,902,991
Issue date
Mar 8, 2011
Applied Materials, Inc.
Beom Soo Park
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Sensors for dynamically detecting substrate breakage and misalignme...
Patent number
7,834,994
Issue date
Nov 16, 2010
Applied Materials, Inc.
William A. Bagley
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for enhancing electronic device manufacturing...
Patent number
7,477,956
Issue date
Jan 13, 2009
Applied Materials, Inc.
Inchen Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for enhancing electronic device manufacturing...
Patent number
7,474,934
Issue date
Jan 6, 2009
Applied Materials, Inc.
Hongbin Ji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensors for dynamically detecting substrate breakage and misalignme...
Patent number
7,440,091
Issue date
Oct 21, 2008
Applied Materials, Inc.
William A. Bagley
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR SUBSTRATE TRANSFER IN A THERMAL TREATMENT...
Publication number
20180337073
Publication date
Nov 22, 2018
Applied Materials, Inc.
James HOFFMAN
F27 - FURNACES KILNS OVENS RETORTS
Information
Patent Application
SYSTEMS, APPARATUS, AND METHODS FOR PROCESSING RECIPE PROTECTION AN...
Publication number
20160054731
Publication date
Feb 25, 2016
Applied Materials, Inc.
James Hoffman
G05 - CONTROLLING REGULATING
Information
Patent Application
DYNAMIC ROUTING CONTROL METHODS AND SYSTEMS FOR A CLUSTER TOOL
Publication number
20130226336
Publication date
Aug 29, 2013
Applied Materials, Inc.
James Hoffman
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
MAINFRAME PREMOVE FOR A CLUSTER TOOL
Publication number
20120059510
Publication date
Mar 8, 2012
Atsushi Kitani
G05 - CONTROLLING REGULATING
Information
Patent Application
Frequency Monitoring to Detect Plasma Process Abnormality
Publication number
20110241892
Publication date
Oct 6, 2011
Beom Soo Park
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FLEXIBLE PROCESS CONDITION MONITORING
Publication number
20110190921
Publication date
Aug 4, 2011
Applied Materials, Inc.
Hong Soon Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Detecting plasma chamber malfunction
Publication number
20100245084
Publication date
Sep 30, 2010
Beom Soo Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSORS FOR DYNAMICALLY DETECTING SUBSTRATE BREAKAGE AND MISALIGNME...
Publication number
20090050270
Publication date
Feb 26, 2009
William A. Bagley
G01 - MEASURING TESTING
Information
Patent Application
Frequency Monitoring to Detect Plasma Process Abnormality
Publication number
20080074255
Publication date
Mar 27, 2008
APPLIED MATERIALS, INC.
Beom Soo Park
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Sensors for dynamically detecting substrate breakage and misalignme...
Publication number
20060087647
Publication date
Apr 27, 2006
William A. Bagley
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for enhancing electronic device manufacturing...
Publication number
20060030966
Publication date
Feb 9, 2006
Inchen Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods and apparatus for enhancing electronic device manufacturing...
Publication number
20060009871
Publication date
Jan 12, 2006
Hongbin Ji
H01 - BASIC ELECTRIC ELEMENTS