James I. Esteves

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El Dorado Hills, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect detection during program verify in a memory sub-system
- Patent number 12,002,526
- Issue date Jun 4, 2024
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect detection during program verify in a memory sub-system
- Patent number 11,315,647
- Issue date Apr 26, 2022
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Capacitance evaluation apparatuses and methods
- Patent number 9,267,980
- Issue date Feb 23, 2016
- Micron Technology, Inc.
- Xinwei Guo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DETECTION DURING PROGRAM VERIFY IN A MEMORY SUB-SYSTEM
- Publication number 20220223215
- Publication date Jul 14, 2022
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECT DETECTION DURING PROGRAM VERIFY IN A MEMORY SUB-SYSTEM
- Publication number 20210343351
- Publication date Nov 4, 2021
- Micron Technology, Inc.
- Pinchou Chiang
- G11 - INFORMATION STORAGE
Information Patent Application
CAPACITANCE EVALUATION APPARATUSES AND METHODS
- Publication number 20130043889
- Publication date Feb 21, 2013
- Micron Technology, Inc.
- Xinwei Guo
- G01 - MEASURING TESTING
Information Patent Application
Self-referencing redundancy scheme for a content addressable memory
- Publication number 20080229154
- Publication date Sep 18, 2008
- James I. Esteves
- G11 - INFORMATION STORAGE