James Joseph Poulin

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Poughquag, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Multiple device test layout
- Patent number 6,037,795
- Issue date Mar 14, 2000
- International Business Machines Corporation
- Ronald G. Filippi
- G01 - MEASURING TESTING
Information Patent Grant
High temperature electromigration stress test system, test socket,...
- Patent number 5,760,595
- Issue date Jun 2, 1998
- International Business Machines Corporation
- Robert Daniel Edwards
- G01 - MEASURING TESTING