James Knapp

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New York, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Slit aperture for diffraction range finding system
- Patent number 8,520,191
- Issue date Aug 27, 2013
- 3Dewitt, LLC
- Thomas D. Ditto
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the automated inspection of yarn packages
- Patent number 6,633,383
- Issue date Oct 14, 2003
- Linetech Industries, Inc.
- Tobias Jackson
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Automated cytological specimen classification system and method
- Patent number 5,287,272
- Issue date Feb 15, 1994
- Neuromedical Systems, Inc.
- Mark R. Rutenberg
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SLIT APERTURE FOR DIFFRACTION RANGE FINDING SYSTEM
- Publication number 20100290120
- Publication date Nov 18, 2010
- 3DEWITT, LLC
- Thomas D. Ditto
- G02 - OPTICS
Information Patent Application
Method and apparatus for the automated inspection and grading of fa...
- Publication number 20040184639
- Publication date Sep 23, 2004
- LINETECH INDUSTRIES, INC.
- Tobias McMullen Jackson
- G01 - MEASURING TESTING