James L. Bertsch

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multipole ion optic assembly
- Patent number 11,152,199
- Issue date Oct 19, 2021
- Agilent Technologies, Inc.
- Robert M. Roberts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quadrupole rod assembly
- Patent number 10,147,595
- Issue date Dec 4, 2018
- Agilent Technologies, Inc.
- Robert M. Roberts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin field terminator for linear quadrupole ion guides, and related...
- Patent number 9,536,723
- Issue date Jan 3, 2017
- Agilent Technologies, Inc.
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual field multipole converging ion guides, hyperbolic ion guides,...
- Patent number 9,449,804
- Issue date Sep 20, 2016
- Agilent Technologies, Inc.
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detector response equalization for enhanced dynamic range
- Patent number 8,890,086
- Issue date Nov 18, 2014
- Agilent Technologies, Inc.
- Noah Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources for improved ionization
- Patent number 8,530,832
- Issue date Sep 10, 2013
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion slicer with accelleration and decelleration optics
- Patent number 8,481,963
- Issue date Jul 9, 2013
- Agilent Technologies, Inc.
- Harvey D. Loucks
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Converging multipole ion guide for ion beam shaping
- Patent number 8,193,489
- Issue date Jun 5, 2012
- Agilent Technologies, Inc.
- James L. Bertsch
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ion sources for improved ionization
- Patent number 8,039,795
- Issue date Oct 18, 2011
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer multipole device
- Patent number 7,507,955
- Issue date Mar 24, 2009
- Agilent Technologies, Inc.
- Robert K. Crawford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multimode ionization source
- Patent number 7,488,953
- Issue date Feb 10, 2009
- Agilent Technologies, Inc.
- Steven M. Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Precision segmented ion trap
- Patent number 7,423,262
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for manipulation of ions and methods of making apparatus
- Patent number 7,329,879
- Issue date Feb 12, 2008
- Agilent Technologies, Inc.
- Jeffrey T. Kernan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 7,309,859
- Issue date Dec 18, 2007
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Multimode ionization source
- Patent number 7,078,681
- Issue date Jul 18, 2006
- Agilent Technologies, Inc.
- Steven M. Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer multipole device
- Patent number 7,064,322
- Issue date Jun 20, 2006
- Agilent Technologies, Inc.
- Robert K. Crawford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 7,002,146
- Issue date Feb 21, 2006
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Precision multiple electrode ion mirror
- Patent number 6,849,846
- Issue date Feb 1, 2005
- Agilent Technologies, Inc.
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 6,812,459
- Issue date Nov 2, 2004
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,797,946
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 6,653,626
- Issue date Nov 25, 2003
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Multimode ionization source
- Patent number 6,646,257
- Issue date Nov 11, 2003
- Agilent Technologies, Inc.
- Steven M. Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,639,216
- Issue date Oct 28, 2003
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,498,343
- Issue date Dec 24, 2002
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric conduit with end electrodes
- Patent number 6,359,275
- Issue date Mar 19, 2002
- Agilent Technologies, Inc.
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,294,779
- Issue date Sep 25, 2001
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,278,110
- Issue date Aug 21, 2001
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry
- Patent number RE36892
- Issue date Oct 3, 2000
- Agilent Technologies
- James A. Apffel
- 250 - Radiant energy
Information Patent Grant
Apparatus for forming liquid droplets having a mechanically fixed i...
- Patent number 6,032,876
- Issue date Mar 7, 2000
- Hewlett-Packard Company
- James L. Bertsch
- G01 - MEASURING TESTING
Information Patent Grant
Ionization chamber and mass spectrometry system containing an asymm...
- Patent number 5,838,003
- Issue date Nov 17, 1998
- Hewlett-Packard Company
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
QUADRUPOLE ROD ASSEMBLY
- Publication number 20180174818
- Publication date Jun 21, 2018
- Agilent Technologies, Inc.
- Robert M. Roberts
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL FIELD MULTIPOLE CONVERGING ION GUIDES, HYPERBOLIC ION GUIDES,...
- Publication number 20160133452
- Publication date May 12, 2016
- Agilent Technologies, Inc.
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SLICER WITH ACCELLERATION AND DECELLERATION OPTICS
- Publication number 20120217387
- Publication date Aug 30, 2012
- Harvey D. Loucks, JR.
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Bladed Ion Slicer
- Publication number 20120217388
- Publication date Aug 30, 2012
- Harvey D. Loucks, JR.
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Ion Sources for Improved Ionization
- Publication number 20120025071
- Publication date Feb 2, 2012
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONVERGING MULTIPOLE ION GUIDE FOR ION BEAM SHAPING
- Publication number 20100301210
- Publication date Dec 2, 2010
- AGILENT TECHNOLOGIES, INC.
- JAMES L. BERTSCH
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Ion Sources For Improved Ionization
- Publication number 20090250608
- Publication date Oct 8, 2009
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time division multiplexing MS with beam converging capillary
- Publication number 20080087815
- Publication date Apr 17, 2008
- AGILENT TECHNOLOGIES, INC.
- Harvey Dean Loucks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsed internal lock mass for axis calibration
- Publication number 20070205361
- Publication date Sep 6, 2007
- Charles William Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsed internal lock mass for axis calibration
- Publication number 20070200060
- Publication date Aug 30, 2007
- Charles William Russ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Precision segmented ion trap
- Publication number 20070114391
- Publication date May 24, 2007
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multimode ionization source
- Publication number 20070023675
- Publication date Feb 1, 2007
- Steven M. Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer multipole device
- Publication number 20060169890
- Publication date Aug 3, 2006
- Robert K. Crawford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20060076505
- Publication date Apr 13, 2006
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER MULTIPOLE DEVICE
- Publication number 20060071162
- Publication date Apr 6, 2006
- Robert K. Crawford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20050045833
- Publication date Mar 3, 2005
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Application
Multimode ionization source
- Publication number 20040079881
- Publication date Apr 29, 2004
- Steven M. Fischer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Orthogonal ion sampling for apci mass spectrometry
- Publication number 20040046118
- Publication date Mar 11, 2004
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20040046126
- Publication date Mar 11, 2004
- Steven M. Fisher
- G01 - MEASURING TESTING
Information Patent Application
Precision multiple electrode ion mirror
- Publication number 20040036029
- Publication date Feb 26, 2004
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20030075680
- Publication date Apr 24, 2003
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20020179832
- Publication date Dec 5, 2002
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20010042829
- Publication date Nov 22, 2001
- James A. Apffel
- G01 - MEASURING TESTING

James L. Bertsch

Person

Patents Grantslast 30 patents

Multipole ion optic assembly

Quadrupole rod assembly

Thin field terminator for linear quadrupole ion guides, and related...

Dual field multipole converging ion guides, hyperbolic ion guides,...

Ion detector response equalization for enhanced dynamic range

Ion sources for improved ionization

Ion slicer with accelleration and decelleration optics

Converging multipole ion guide for ion beam shaping

Ion sources for improved ionization

Mass spectrometer multipole device

Multimode ionization source

Precision segmented ion trap

Apparatus for manipulation of ions and methods of making apparatus

Ion sampling for APPI mass spectrometry

Multimode ionization source

Mass spectrometer multipole device

Ion sampling for APPI mass spectrometry

Precision multiple electrode ion mirror

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Ion sampling for APPI mass spectrometry

Multimode ionization source

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Dielectric conduit with end electrodes

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry

Apparatus for forming liquid droplets having a mechanically fixed i...

Ionization chamber and mass spectrometry system containing an asymm...

Patents Applicationslast 30 patents

QUADRUPOLE ROD ASSEMBLY

DUAL FIELD MULTIPOLE CONVERGING ION GUIDES, HYPERBOLIC ION GUIDES,...

ION SLICER WITH ACCELLERATION AND DECELLERATION OPTICS

Bladed Ion Slicer

Ion Sources for Improved Ionization

CONVERGING MULTIPOLE ION GUIDE FOR ION BEAM SHAPING

Ion Sources For Improved Ionization

Time division multiplexing MS with beam converging capillary

Pulsed internal lock mass for axis calibration

Pulsed internal lock mass for axis calibration

Precision segmented ion trap

Multimode ionization source

Mass spectrometer multipole device

Ion sampling for APPI mass spectrometry

MASS SPECTROMETER MULTIPOLE DEVICE

Ion sampling for APPI mass spectrometry

Multimode ionization source

Orthogonal ion sampling for apci mass spectrometry

Ion sampling for APPI mass spectrometry

Precision multiple electrode ion mirror

Orthogonal ion sampling for APCI mass spectrometry

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry