James M. Brafford

Person

Mission Viejo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method of automatically carrying IC-chips, on a planar array of vac...
- Patent number 7,355,386
- Issue date Apr 8, 2008
- Delta Design, Inc.
- Randy Neaman Siade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for testing one or more groups of IC-chips while concurrentl...
- Patent number 6,924,636
- Issue date Aug 2, 2005
- Unisys Corporation
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Grant
System for testing a group of IC-chips having a chip holding subass...
- Patent number 6,919,718
- Issue date Jul 19, 2005
- Unisys Corporation
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Grant
System for testing multiple groups of IC-chips which concurrently s...
- Patent number 6,909,299
- Issue date Jun 21, 2005
- Unisys Corporation
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester having a fail-safe mechanism for moving I...
- Patent number 6,581,486
- Issue date Jun 24, 2003
- Unisys Corporation
- David John Ditri
- G01 - MEASURING TESTING
Information Patent Grant
Pivoting springy mechanism that opens and closes pressed electrical...
- Patent number 6,307,391
- Issue date Oct 23, 2001
- Unisys Corporation
- Jerry Ihor Tustaniwskyj
- G01 - MEASURING TESTING
Information Patent Grant
Electromechanical apparatus for testing IC chips using first and se...
- Patent number 6,307,388
- Issue date Oct 23, 2001
- Unisys Corporation
- Lawrence William Friedrich
- G01 - MEASURING TESTING
Information Patent Grant
Quick-release spacer-latching-connector assembly
- Patent number 4,844,565
- Issue date Jul 4, 1989
- Unisys Corporation
- James M. Brafford
- A47 - FURNITURE DOMESTIC ARTICLES OR APPLIANCES COFFEE MILLS SPICE MILLS SUCT...

Patents Applicationslast 30 patents

Information Patent Application
Method of automatically carrying IC-chips, on a planar array of vac...
- Publication number 20070115015
- Publication date May 24, 2007
- UNISYS CORPORATION
- Randy Neaman Siade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR TESTING ONE OR MORE GROUPS OF IC-CHIPS WHILE CONCURRENTL...
- Publication number 20050099174
- Publication date May 12, 2005
- UNISYS CORPORATION
- Randy Neaman Siade
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING A GROUP OF IC-CHIPS HAVING A CHIP HOLDING SUBASS...
- Publication number 20050099173
- Publication date May 12, 2005
- UNISYS CORPORATION
- Randy Neaman Siade
- G01 - MEASURING TESTING

James M. Brafford

Person

Patents Grantslast 30 patents

Method of automatically carrying IC-chips, on a planar array of vac...

System for testing one or more groups of IC-chips while concurrentl...

System for testing a group of IC-chips having a chip holding subass...

System for testing multiple groups of IC-chips which concurrently s...

Integrated circuit tester having a fail-safe mechanism for moving I...

Pivoting springy mechanism that opens and closes pressed electrical...

Electromechanical apparatus for testing IC chips using first and se...

Quick-release spacer-latching-connector assembly

Patents Applicationslast 30 patents

Method of automatically carrying IC-chips, on a planar array of vac...

SYSTEM FOR TESTING ONE OR MORE GROUPS OF IC-CHIPS WHILE CONCURRENTL...

SYSTEM FOR TESTING A GROUP OF IC-CHIPS HAVING A CHIP HOLDING SUBASS...