James M. Crafts

Person

Warren, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adaptive frequency optimization in processors
- Patent number 11,422,611
- Issue date Aug 23, 2022
- International Business Machines Corporation
- Nathaniel R. Chadwick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive frequency optimization in processors
- Patent number 10,509,457
- Issue date Dec 17, 2019
- International Business Machines Corporation
- Nathaniel R. Chadwick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low-voltage IC test for defect screening
- Patent number 9,285,417
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Daniel J. Poindexter
- G01 - MEASURING TESTING
Information Patent Grant
Programmable active thermal control
- Patent number 9,152,517
- Issue date Oct 6, 2015
- International Business Machines Corporation
- Harold Chase
- G01 - MEASURING TESTING
Information Patent Grant
Calibration of an on-die thermal sensor
- Patent number 8,734,006
- Issue date May 27, 2014
- International Business Machines Corporation
- James M. Crafts
- G01 - MEASURING TESTING
Information Patent Grant
Segmented architecture for wafer test and burn-in
- Patent number 6,275,051
- Issue date Aug 14, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING UTILITY INFRASTRUCTURE AND CONNECTIVITY INTERRUPTIONS
- Publication number 20230044197
- Publication date Feb 9, 2023
- International Business Machines Corporation
- Madhana Sunder
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE FREQUENCY OPTIMIZATION IN PROCESSORS
- Publication number 20200073459
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Nathaniel R. Chadwick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE FREQUENCY OPTIMIZATION IN PROCESSORS
- Publication number 20180292878
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Nathaniel R. Chadwick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW-VOLTAGE IC TEST FOR DEFECT SCREENING
- Publication number 20140184262
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Daniel J. Poindexter
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE ACTIVE THERMAL CONTROL
- Publication number 20120272100
- Publication date Oct 25, 2012
- International Business Machines Corporation
- Harold Chase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION OF AN ON-DIE THERMAL SENSOR
- Publication number 20120224602
- Publication date Sep 6, 2012
- International Business Machines Corporation
- James M. CRAFTS
- G01 - MEASURING TESTING
Information Patent Application
Segmented architecture for wafer test & burn-in
- Publication number 20010050567
- Publication date Dec 13, 2001
- International Business Machines Corporation
- Thomas W. Bachelder
- G01 - MEASURING TESTING

James M. Crafts

Person

Patents Grantslast 30 patents

Adaptive frequency optimization in processors

Adaptive frequency optimization in processors

Low-voltage IC test for defect screening

Programmable active thermal control

Calibration of an on-die thermal sensor

Segmented architecture for wafer test and burn-in

Patents Applicationslast 30 patents

DETERMINING UTILITY INFRASTRUCTURE AND CONNECTIVITY INTERRUPTIONS

ADAPTIVE FREQUENCY OPTIMIZATION IN PROCESSORS

ADAPTIVE FREQUENCY OPTIMIZATION IN PROCESSORS

LOW-VOLTAGE IC TEST FOR DEFECT SCREENING

PROGRAMMABLE ACTIVE THERMAL CONTROL

CALIBRATION OF AN ON-DIE THERMAL SENSOR

Segmented architecture for wafer test & burn-in