James M. Young

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Santa Barbara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
AFM imaging with metrology-preserving real time denoising
- Patent number 11,796,565
- Issue date Oct 24, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of compensating for position shift
- Patent number 8,050,802
- Issue date Nov 1, 2011
- Bruker Nano, Inc.
- James M. Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for rapid automatic engagement of a probe
- Patent number 7,665,349
- Issue date Feb 23, 2010
- Veeco Instruments Inc.
- Paul I. Mininni
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope having automatic probe exchange and align...
- Patent number 5,705,814
- Issue date Jan 6, 1998
- Digital Instruments, Inc.
- James M. Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical profiler for films and substrates
- Patent number 5,042,949
- Issue date Aug 27, 1991
- Jeffrey S. Greenberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM Imaging with Metrology-Preserving Real Time Denoising
- Publication number 20220326277
- Publication date Oct 13, 2022
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS OF COMPENSATING FOR POSITION SHIFT
- Publication number 20080121813
- Publication date May 29, 2008
- James M. Young
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for rapid automatic engagement of a prove
- Publication number 20060230474
- Publication date Oct 12, 2006
- Paul I. Mininni
- G01 - MEASURING TESTING