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James Massie
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Santa Barbara, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Hermetically-sealed vehicle lidar assembly
Patent number
12,019,184
Issue date
Jun 25, 2024
Continental Autonomous Mobility US, LLC
Goran Vuletici
G01 - MEASURING TESTING
Information
Patent Grant
Actuators for securing probes in a scanning probe microscope
Patent number
9,372,203
Issue date
Jun 21, 2016
JAMES MASSIE DESIGN, INC.
James Massie
G01 - MEASURING TESTING
Information
Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
Patent number
8,087,288
Issue date
Jan 3, 2012
Bruker Nano, Inc.
Craig B. Prater
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning probe microscope having improved optical access
Patent number
7,962,966
Issue date
Jun 14, 2011
Agilent Technologies, Inc.
James Robert Massie
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Balanced momentum probe holder
Patent number
7,219,538
Issue date
May 22, 2007
Veeco Instruments, Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for isolating and measuring movement in a metr...
Patent number
6,928,863
Issue date
Aug 16, 2005
Veeco Instruments Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Grant
Balanced momentum probe holder
Patent number
6,861,649
Issue date
Mar 1, 2005
Veeco Instruments, Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for isolating and measuring movement in metrol...
Patent number
6,612,160
Issue date
Sep 2, 2003
Veeco Instruments, Inc.
James R Massie
G01 - MEASURING TESTING
Information
Patent Grant
Balanced momentum probe holder
Patent number
6,590,208
Issue date
Jul 8, 2003
Veeco Instruments Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for isolating and measuring movement in a metr...
Patent number
6,530,268
Issue date
Mar 11, 2003
Veeco Instruments, Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
Patent number
6,032,518
Issue date
Mar 7, 2000
Digital Instruments, Inc.
Craig B. Prater
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
Patent number
5,714,682
Issue date
Feb 3, 1998
Digital Instruments, Inc.
Craig B. Prater
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
Patent number
5,560,244
Issue date
Oct 1, 1996
Digital Instruments, Inc.
Craig B. Prater
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Scanning stylus atomic force microscope with cantilever tracking an...
Patent number
5,463,897
Issue date
Nov 7, 1995
Digital Instruments, Inc.
Craig B. Prater
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
HERMETICALLY-SEALED VEHICLE LIDAR ASSEMBLY
Publication number
20220187425
Publication date
Jun 16, 2022
CONTINENTAL AUTOMOTIVE SYSTEMS, INC.
Goran Vuletici
G01 - MEASURING TESTING
Information
Patent Application
ACTIVELY ALIGNED SOLID-STATE LIDAR SYSTEM
Publication number
20200341119
Publication date
Oct 29, 2020
CONTINENTAL AUTOMOTIVE SYSTEMS, INC.
Elliot Smith
G01 - MEASURING TESTING
Information
Patent Application
AUTOMOTIVE ELECTRONIC SENSOR ASSEMBLY TEMPERATURE REGULATION SYSTEM
Publication number
20200182124
Publication date
Jun 11, 2020
CONTINENTAL AUTOMOTIVE SYSTEMS, INC.
James Robert Massie
B60 - VEHICLES IN GENERAL
Information
Patent Application
Scanning Probe Microscope having Improved Optical Access
Publication number
20100306884
Publication date
Dec 2, 2010
James Robert Massie
G01 - MEASURING TESTING
Information
Patent Application
Balanced momentum probe holder
Publication number
20060043286
Publication date
Mar 2, 2006
Veeco Instruments, Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Application
Cantilever array sensor system
Publication number
20050121615
Publication date
Jun 9, 2005
Craig Prater
G02 - OPTICS
Information
Patent Application
Apparatus and method for isolating and measuring movement in a metr...
Publication number
20040134264
Publication date
Jul 15, 2004
Veeco Instruments Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Application
Balanced momentum probe holder
Publication number
20040069944
Publication date
Apr 15, 2004
Veeco Instruments, Inc.
James R. Massie
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for isolating and measuring movement in metrol...
Publication number
20020124636
Publication date
Sep 12, 2002
Veeco Instruments Inc.
James R. Massie
B82 - NANO-TECHNOLOGY
Information
Patent Application
Apparatus and method for isolating and measuring movement in a metr...
Publication number
20020125415
Publication date
Sep 12, 2002
James R. Massie
B82 - NANO-TECHNOLOGY
Information
Patent Application
Balanced momentum probe holder
Publication number
20020096642
Publication date
Jul 25, 2002
James R. Massie
B82 - NANO-TECHNOLOGY
Information
Patent Application
Cantilever array sensor system
Publication number
20020092340
Publication date
Jul 18, 2002
Veeco Instruments Inc.
Craig Prater
G01 - MEASURING TESTING