James McKenna

Person

Bohemia, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated waveform analysis methods using a parallel automated deve...
- Patent number 10,598,722
- Issue date Mar 24, 2020
- Advanced Testing Technologies, Inc.
- Robert Spinner
- G01 - MEASURING TESTING
Information Patent Grant
Automated waveform analysis methods using a parallel automated deve...
- Patent number 10,151,791
- Issue date Dec 11, 2018
- Advanced Testing Technologies, Inc.
- Robert Spinner
- G01 - MEASURING TESTING
Information Patent Grant
Automated waveform analysis using a parallel automated development...
- Patent number 9,864,003
- Issue date Jan 9, 2018
- Advanced Testing Technologies, Inc.
- Robert Spinner
- G01 - MEASURING TESTING
Information Patent Grant
Automated waveform analysis using a parallel automated development...
- Patent number 9,739,827
- Issue date Aug 22, 2017
- Advanced Testing Technologies, Inc.
- Robert Spinner
- G01 - MEASURING TESTING
Information Patent Grant
Instrumentation ATS/TPS mitigation utilizing I/O data stream
- Patent number 8,359,585
- Issue date Jan 22, 2013
- Advanced Testing Technologies, Inc.
- Robert Spinner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Obsolescence mitigation for programmable waveform digitizers
- Patent number 7,642,940
- Issue date Jan 5, 2010
- Advanced Testing Technologies, Inc.
- James McKenna
- G01 - MEASURING TESTING
Information Patent Grant
Obsolescence mitigation for electron bombarded semiconductor tubes...
- Patent number 7,358,877
- Issue date Apr 15, 2008
- Advanced Testing Technologies, Inc.
- Robert M. Buckley
- G01 - MEASURING TESTING

James McKenna

Person

Patents Grantslast 30 patents

Automated waveform analysis methods using a parallel automated deve...

Automated waveform analysis methods using a parallel automated deve...

Automated waveform analysis using a parallel automated development...

Automated waveform analysis using a parallel automated development...

Instrumentation ATS/TPS mitigation utilizing I/O data stream

Obsolescence mitigation for programmable waveform digitizers

Obsolescence mitigation for electron bombarded semiconductor tubes...