James Michael Hammond

Person

Boca Raton, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning force microscope with automatic surface engagement
- Patent number 6,318,159
- Issue date Nov 20, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Controlling motion of a scanning force microscope probe tip moving...
- Patent number 6,234,009
- Issue date May 22, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 6,220,084
- Issue date Apr 24, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for determining side wall profiles using a sca...
- Patent number 6,169,281
- Issue date Jan 2, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 6,167,753
- Issue date Jan 2, 2001
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automatic probe replacement in a scanning probe microscope
- Patent number 6,093,930
- Issue date Jul 25, 2000
- International Business Machnines Corporation
- James Edward Boyette
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with automatic surface engagement and imp...
- Patent number 6,079,254
- Issue date Jun 27, 2000
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting fields with a single-pass, dual-amplitude-mode scanning f...
- Patent number 5,918,274
- Issue date Jun 29, 1999
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Controlling engagement of a scanning microscope probe with a segmen...
- Patent number 5,902,928
- Issue date May 11, 1999
- International Business Machines Corporation
- Dong Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,804,982
- Issue date Sep 8, 1998
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for controlling high-speed probe actuators
- Patent number 5,635,848
- Issue date Jun 3, 1997
- International Business Machines Corporation
- James M. Hammond
- G01 - MEASURING TESTING
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,635,849
- Issue date Jun 3, 1997
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
High speed test probe positioning system
- Patent number 5,550,483
- Issue date Aug 27, 1996
- International Business Machines
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,532,611
- Issue date Jul 2, 1996
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Dual quad flexure scanner
- Patent number 5,360,974
- Issue date Nov 1, 1994
- International Business Machines Corp.
- James M. Hammond
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automatic tip approach method and apparatus for scanning probe micr...
- Patent number 5,262,643
- Issue date Nov 16, 1993
- International Business Machines Corp.
- James M. Hammond
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample carriage for scanning probe microscope
- Patent number 5,260,577
- Issue date Nov 9, 1993
- International Business Machines Corp.
- David W. Abraham
- G01 - MEASURING TESTING

James Michael Hammond

Person

Patents Grantslast 30 patents

Scanning force microscope with automatic surface engagement

Controlling motion of a scanning force microscope probe tip moving...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Apparatus and method for determining side wall profiles using a sca...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Automatic probe replacement in a scanning probe microscope

Scanning force microscope with automatic surface engagement and imp...

Detecting fields with a single-pass, dual-amplitude-mode scanning f...

Controlling engagement of a scanning microscope probe with a segmen...

Miniature probe positioning actuator

Method and system for controlling high-speed probe actuators

Miniature probe positioning actuator

High speed test probe positioning system

Miniature probe positioning actuator

Dual quad flexure scanner

Automatic tip approach method and apparatus for scanning probe micr...

Sample carriage for scanning probe microscope