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James N. Eilbeck
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Ringwood, NJ, US
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last 30 patents
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Patent Grant
Method of forming a resist pattern by radiation exposure of positiv...
Patent number
4,650,745
Issue date
Mar 17, 1987
Philip A. Hunt Chemical Corporation
James N. Eilbeck
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Positive-working o-quinone diazide photoresist composition containi...
Patent number
4,626,492
Issue date
Dec 2, 1986
Olin Hunt Specialty Products, Inc.
James N. Eilbeck
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY