James Nelson Stainton

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 9,389,408
- Issue date Jul 12, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160253813
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160252714
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20120019626
- Publication date Jan 26, 2012
- Zeta Instruments, Inc.
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING