James P. Di Sarro

Person

Essex, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compact area electrostatic discharge protection circuit
- Patent number 12,040,322
- Issue date Jul 16, 2024
- Texas Instruments Incorporated
- James Paul DiSarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SCR having selective well contacts
- Patent number 12,027,612
- Issue date Jul 2, 2024
- Texas Instruments Incorporated
- Karmel Kranthi Nagothu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD device with fast response and high transient current
- Patent number 11,532,609
- Issue date Dec 20, 2022
- Texas Instruments Incorporate
- Aravind C. Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection system
- Patent number 11,527,530
- Issue date Dec 13, 2022
- Texas Instruments Incorporated
- Krishna Praveen Mysore Rajagopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductivity modulated drain extended MOSFET
- Patent number 11,139,292
- Issue date Oct 5, 2021
- Texas Instruments Incorporated
- Aravind C Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection charge pump active clamp for low-leakage applications
- Patent number 11,114,848
- Issue date Sep 7, 2021
- Texas Instruments Incorporated
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
ESD device with fast response and high transient current
- Patent number 10,861,844
- Issue date Dec 8, 2020
- Texas Instruments Incorporated
- Aravind C. Appaswamy
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
ESD network comprising variable impedance discharge path
- Patent number 10,763,251
- Issue date Sep 1, 2020
- Texas Instruments Incorporated
- Krishna Praveen Mysore Rajagopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 10,756,078
- Issue date Aug 25, 2020
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conductivity modulated drain extended MOSFET
- Patent number 10,529,708
- Issue date Jan 7, 2020
- Texas Instruments Incorporated
- Aravind C Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ESD protection charge pump active clamp for low-leakage applications
- Patent number 10,396,550
- Issue date Aug 27, 2019
- Texas Instruments Incorporated
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Integrated circuit protection during high-current ESD testing
- Patent number 10,359,461
- Issue date Jul 23, 2019
- International Business Machines Corporation
- Shunhua Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IGBT coupled to a reverse bias device in series
- Patent number 10,249,610
- Issue date Apr 2, 2019
- Texas Instruments Incorporated
- Aravind Chennimalai Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 10,181,463
- Issue date Jan 15, 2019
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conductivity modulated drain extended MOSFET
- Patent number 9,905,558
- Issue date Feb 27, 2018
- Texas Instruments Incorporated
- Aravind C Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit protection during high-current ESD testing
- Patent number 9,869,708
- Issue date Jan 16, 2018
- International Business Machines Corporation
- Shunhua Chang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 9,620,497
- Issue date Apr 11, 2017
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Methodology of grading reliability and performance of chips across...
- Patent number 9,575,115
- Issue date Feb 21, 2017
- GLOBALFOUNDRIES Inc.
- Nathaniel R. Chadwick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SCR with fin body regions for ESD protection
- Patent number 9,536,870
- Issue date Jan 3, 2017
- GLOBALFOUNDRIES Inc.
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit protection during high-current ESD testing
- Patent number 9,435,841
- Issue date Sep 6, 2016
- International Business Machines Corporation
- Shunhua Chang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrostatic discharge protection circuit with a fail-safe mechanism
- Patent number 9,413,169
- Issue date Aug 9, 2016
- GLOBALFOUNDRIES Inc.
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Cancellation of secondary reverse reflections in a very-fast transm...
- Patent number 9,377,496
- Issue date Jun 28, 2016
- International Business Machines Corporation
- Shunhua T. Chang
- G01 - MEASURING TESTING
Information Patent Grant
Cancellation of secondary reverse reflections in a very-fast transm...
- Patent number 9,274,155
- Issue date Mar 1, 2016
- International Business Machines Corporation
- Shunhua T. Chang
- G01 - MEASURING TESTING
Information Patent Grant
Self-protected metal-oxide-semiconductor field-effect transistor
- Patent number 9,263,402
- Issue date Feb 16, 2016
- GLOBALFOUNDRIES Inc.
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SCR with fin body regions for ESD protection
- Patent number 9,240,471
- Issue date Jan 19, 2016
- GLOBALFOUNDRIES Inc.
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure and method for dynamic biasing to improve ESD robustness...
- Patent number 9,219,055
- Issue date Dec 22, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual three-dimensional (3D) resistor and methods of forming
- Patent number 9,064,786
- Issue date Jun 23, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bi-directional silicon controlled rectifier structure
- Patent number 9,059,198
- Issue date Jun 16, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon controlled rectifier with integral deep trench capacitor
- Patent number 9,006,783
- Issue date Apr 14, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-protected metal-oxide-semiconductor field-effect transistor
- Patent number 8,987,073
- Issue date Mar 24, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
QUASI-STATIC ESD CLAMP
- Publication number 20240372356
- Publication date Nov 7, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Krishna Praveen MYSORE RAJAGOPAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT AREA ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT
- Publication number 20240332284
- Publication date Oct 3, 2024
- TEXAS INSTRUMENTS INCORPORATED
- James Paul DiSarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROTECTION DEVICES WITH HIGH AREA EFFICIENCY
- Publication number 20230238378
- Publication date Jul 27, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Krishna Praveen Mysore Rajagopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION SYSTEM
- Publication number 20220223581
- Publication date Jul 14, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Krishna Praveen Mysore Rajagopal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT AREA ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT
- Publication number 20220223580
- Publication date Jul 14, 2022
- TEXAS INSTRUMENTS INCORPORATED
- James Paul DiSarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCR HAVING SELECTIVE WELL CONTACTS
- Publication number 20220223723
- Publication date Jul 14, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Karmel Kranthi Nagothu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD DEVICE WITH FAST RESPONSE AND HIGH TRANSIENT CURRENT
- Publication number 20210091068
- Publication date Mar 25, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Aravind C. Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductivity Modulated Drain Extended MOSFET
- Publication number 20200075584
- Publication date Mar 5, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Aravind C Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ESD Protection Charge Pump Active Clamp for Low-Leakage Applications
- Publication number 20190341773
- Publication date Nov 7, 2019
- TEXAS INSTRUMENTS INCORPORATED
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ESD NETWORK COMPRISING VARIABLE IMPEDANCE DISCHARGE PATH
- Publication number 20190096874
- Publication date Mar 28, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Krishna Praveen Mysore Rajagopal
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ESD DEVICE WITH FAST RESPONSE AND HIGH TRANSIENT CURRENT
- Publication number 20190043854
- Publication date Feb 7, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Aravind C. Appaswamy
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Conductivity Modulated Drain Extended MOSFET
- Publication number 20180182755
- Publication date Jun 28, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Aravind C Appaswamy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20180100883
- Publication date Apr 12, 2018
- International Business Machines Corporation
- SHUNHUA CHANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20180100884
- Publication date Apr 12, 2018
- International Business Machines Corporation
- SHUNHUA CHANG
- G01 - MEASURING TESTING
Information Patent Application
ESD PROTECTION CHARGE PUMP ACTIVE CLAMP FOR LOW-LEAKAGE APPLICATIONS
- Publication number 20180097357
- Publication date Apr 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20170133839
- Publication date May 11, 2017
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SCR WITH FIN BODY REGIONS FOR ESD PROTECTION
- Publication number 20160111414
- Publication date Apr 21, 2016
- GLOBALFOUNDRIES INC.
- James P. DI SARRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING
- Publication number 20160033564
- Publication date Feb 4, 2016
- International Business Machines Corporation
- SHUNHUA CHANG
- G01 - MEASURING TESTING
Information Patent Application
CANCELLATION OF SECONDARY REVERSE REFLECTIONS IN A VERY-FAST TRANSM...
- Publication number 20160018452
- Publication date Jan 21, 2016
- International Business Machines Corporation
- Shunhua T. CHANG
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20150364914
- Publication date Dec 17, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...
- Publication number 20150363539
- Publication date Dec 17, 2015
- International Business Machines Corporation
- James P. Di Sarro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT WITH A FAIL-SAFE MECHANISM
- Publication number 20150288174
- Publication date Oct 8, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SELF-PROTECTED METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR
- Publication number 20150115364
- Publication date Apr 30, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCR WITH FIN BODY REGIONS FOR ESD PROTECTION
- Publication number 20150060939
- Publication date Mar 5, 2015
- International Business Machines Corporation
- James P. DI SARRO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BI-DIRECTIONAL SILICON CONTROLLED RECTIFIER STRUCTURE
- Publication number 20150050784
- Publication date Feb 19, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CONTROLLED RECTIFIER WITH INTEGRAL DEEP TRENCH CAPACITOR
- Publication number 20150001580
- Publication date Jan 1, 2015
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL THREE-DIMENSIONAL (3D) RESISTOR AND METHODS OF FORMING
- Publication number 20140264752
- Publication date Sep 18, 2014
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BI-DIRECTIONAL SILICON CONTROLLED RECTIFIER STRUCTURE
- Publication number 20140239343
- Publication date Aug 28, 2014
- International Business Machines Corporation
- James P. Di Sarro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGY OF GRADING RELIABILITY AND PERFORMANCE OF CHIPS ACROSS...
- Publication number 20140107822
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Nathaniel R. Chadwick
- G01 - MEASURING TESTING
Information Patent Application
CANCELLATION OF SECONDARY REVERSE REFLECTIONS IN A VERY-FAST TRANSM...
- Publication number 20140084950
- Publication date Mar 27, 2014
- International Business Machines Corporation
- Shunhua T. CHANG
- G01 - MEASURING TESTING

James P. Di Sarro

Person

Patents Grantslast 30 patents

Compact area electrostatic discharge protection circuit

SCR having selective well contacts

ESD device with fast response and high transient current

Electrostatic discharge protection system

Conductivity modulated drain extended MOSFET

ESD protection charge pump active clamp for low-leakage applications

ESD device with fast response and high transient current

ESD network comprising variable impedance discharge path

Structure and method for dynamic biasing to improve ESD robustness...

Conductivity modulated drain extended MOSFET

ESD protection charge pump active clamp for low-leakage applications

Integrated circuit protection during high-current ESD testing

IGBT coupled to a reverse bias device in series

Structure and method for dynamic biasing to improve ESD robustness...

Conductivity modulated drain extended MOSFET

Integrated circuit protection during high-current ESD testing

Structure and method for dynamic biasing to improve ESD robustness...

Methodology of grading reliability and performance of chips across...

SCR with fin body regions for ESD protection

Integrated circuit protection during high-current ESD testing

Electrostatic discharge protection circuit with a fail-safe mechanism

Cancellation of secondary reverse reflections in a very-fast transm...

Cancellation of secondary reverse reflections in a very-fast transm...

Self-protected metal-oxide-semiconductor field-effect transistor

SCR with fin body regions for ESD protection

Structure and method for dynamic biasing to improve ESD robustness...

Dual three-dimensional (3D) resistor and methods of forming

Bi-directional silicon controlled rectifier structure

Silicon controlled rectifier with integral deep trench capacitor

Self-protected metal-oxide-semiconductor field-effect transistor

Patents Applicationslast 30 patents

QUASI-STATIC ESD CLAMP

COMPACT AREA ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT

SEMICONDUCTOR PROTECTION DEVICES WITH HIGH AREA EFFICIENCY

ELECTROSTATIC DISCHARGE PROTECTION SYSTEM

COMPACT AREA ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT

SCR HAVING SELECTIVE WELL CONTACTS

ESD DEVICE WITH FAST RESPONSE AND HIGH TRANSIENT CURRENT

Conductivity Modulated Drain Extended MOSFET

ESD Protection Charge Pump Active Clamp for Low-Leakage Applications

ESD NETWORK COMPRISING VARIABLE IMPEDANCE DISCHARGE PATH

ESD DEVICE WITH FAST RESPONSE AND HIGH TRANSIENT CURRENT

Conductivity Modulated Drain Extended MOSFET

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING

ESD PROTECTION CHARGE PUMP ACTIVE CLAMP FOR LOW-LEAKAGE APPLICATIONS

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

SCR WITH FIN BODY REGIONS FOR ESD PROTECTION

INTEGRATED CIRCUIT PROTECTION DURING HIGH-CURRENT ESD TESTING

CANCELLATION OF SECONDARY REVERSE REFLECTIONS IN A VERY-FAST TRANSM...

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

STRUCTURE AND METHOD FOR DYNAMIC BIASING TO IMPROVE ESD ROBUSTNESS...

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT WITH A FAIL-SAFE MECHANISM

SELF-PROTECTED METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR

SCR WITH FIN BODY REGIONS FOR ESD PROTECTION

BI-DIRECTIONAL SILICON CONTROLLED RECTIFIER STRUCTURE

SILICON CONTROLLED RECTIFIER WITH INTEGRAL DEEP TRENCH CAPACITOR

DUAL THREE-DIMENSIONAL (3D) RESISTOR AND METHODS OF FORMING

BI-DIRECTIONAL SILICON CONTROLLED RECTIFIER STRUCTURE

METHODOLOGY OF GRADING RELIABILITY AND PERFORMANCE OF CHIPS ACROSS...

CANCELLATION OF SECONDARY REVERSE REFLECTIONS IN A VERY-FAST TRANSM...