James P. Olivier

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Lawrenceville, GA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for determining the size distribution of parti...
- Patent number 6,091,492
- Issue date Jul 18, 2000
- Micromeritics Instrument Corporation
- Michael L. Strickland
- G01 - MEASURING TESTING
Information Patent Grant
System and method for evenly suspending and circulating particles i...
- Patent number 5,849,064
- Issue date Dec 15, 1998
- Micromeritics Instrument Corporation
- William P. Marco
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining the size distribution of parti...
- Patent number 5,576,827
- Issue date Nov 19, 1996
- Micromeritics Instrument Corporation
- Michael L. Strickland
- G01 - MEASURING TESTING
Information Patent Grant
X-ray particle size analyzer
- Patent number 5,247,558
- Issue date Sep 21, 1993
- Micromeritics Instrument Corporation
- Warren P. Hendrix
- G01 - MEASURING TESTING
Information Patent Grant
X-ray particle size analyzer
- Patent number 4,920,550
- Issue date Apr 24, 1990
- Micromeritics Instrument Corporation
- James P. Olivier
- G01 - MEASURING TESTING
Information Patent Grant
Continuous volume measuring system
- Patent number 4,356,727
- Issue date Nov 2, 1982
- Carole E. Brown
- G01 - MEASURING TESTING