James P. Spallas

Person

Ithaca, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Segmented multi-channel, backside illuminated, solid state detector...
- Patent number 11,699,607
- Issue date Jul 11, 2023
- KLA Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging apparatus having a plurality of movable beam columns, and m...
- Patent number 10,026,588
- Issue date Jul 17, 2018
- Keysight Technologies, Inc.
- Kurt Stephen Werder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage energy-dispersive spectroscopy using a low-voltage sca...
- Patent number 9,099,276
- Issue date Aug 4, 2015
- Keysight Technologies, Inc.
- Lawrence P. Muray
- G01 - MEASURING TESTING
Information Patent Grant
Layered scanning charged particle apparatus package having an embed...
- Patent number 8,115,168
- Issue date Feb 14, 2012
- Agilent Technologies, Inc.
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layered scanning charged particle microscope package for a charged...
- Patent number 8,110,801
- Issue date Feb 7, 2012
- Agilent Technologies, Inc.
- Scott W. Indermuehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layered scanning charged particle microscope with differential pump...
- Patent number 8,106,358
- Issue date Jan 31, 2012
- Agilent Technologies, Inc.
- James P. Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated deflectors for beam alignment and blanking in charged pa...
- Patent number 8,003,952
- Issue date Aug 23, 2011
- Agilent Technologies, Inc.
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked lens structure and method of use thereof for preventing ele...
- Patent number 7,335,895
- Issue date Feb 26, 2008
- Novelx, Inc.
- James Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for multiple electron, ion, and photon beam align...
- Patent number 7,332,729
- Issue date Feb 19, 2008
- Novelx, Inc.
- Lawrence Muray
- G01 - MEASURING TESTING
Information Patent Grant
Methods for fabricating redeposition free thin film CPP read sensors
- Patent number 7,111,382
- Issue date Sep 26, 2006
- Western Digital (Fremont), Inc.
- Kenneth E. Knapp
- G11 - INFORMATION STORAGE
Information Patent Grant
Layered electron beam column and method of use thereof
- Patent number 7,109,486
- Issue date Sep 19, 2006
- Novelx, Inc.
- James Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked lens structure and method of use thereof for preventing ele...
- Patent number 7,045,794
- Issue date May 16, 2006
- Novelx, Inc.
- James Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for redeposition free thin film CPP read senso...
- Patent number 6,833,979
- Issue date Dec 21, 2004
- Western Digital (Fremont), Inc.
- Kenneth E. Knapp
- G11 - INFORMATION STORAGE
Information Patent Grant
MEMS structure with mechanical overdeflection limiter
- Patent number 6,805,454
- Issue date Oct 19, 2004
- Glimmerglass Networks, Inc.
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Thin film read head structure with improved bias magnet-to-magnetor...
- Patent number 6,735,850
- Issue date May 18, 2004
- Western Digital (Fremont), Inc.
- Matthew Gibbons
- G11 - INFORMATION STORAGE
Information Patent Grant
Parallel plate electron multiplier
- Patent number 6,642,637
- Issue date Nov 4, 2003
- Applied Materials, Inc.
- James P Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS structure with mechanical overdeflection limiter
- Patent number 6,641,273
- Issue date Nov 4, 2003
- Glimmerglass Networks, Inc.
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
High precision flexure stage
- Patent number 6,555,829
- Issue date Apr 29, 2003
- Applied Materials, Inc.
- James P. Spallas
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Thin film read head structure with improved bias magnet-to-magnetor...
- Patent number 6,487,056
- Issue date Nov 26, 2002
- Read-Rite Corporation
- Matthew Gibbons
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure and method for redeposition free thin film CPP read senso...
- Patent number 6,433,970
- Issue date Aug 13, 2002
- Read-Rite Corporation
- Kenneth E. Knapp
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thin film read head structure with improved bias magnet-to-magnetor...
- Patent number 6,421,212
- Issue date Jul 16, 2002
- Read-Rite Corporation
- Matthew Gibbons
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Silicon tip field emission cathodes
- Patent number 5,627,427
- Issue date May 6, 1997
- Cornell Research Foundation, Inc.
- John H. Das
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon tip field emission cathode arrays and fabrication thereof
- Patent number 5,199,917
- Issue date Apr 6, 1993
- Cornell Research Foundation, Inc.
- Noel C. MacDonald
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MINIATURE HYBRID ELECTRON BEAM COLUMN
- Publication number 20230326704
- Publication date Oct 12, 2023
- KLA Corporation
- Lawrence Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEGMENTED MULTI-CHANNEL, BACKSIDE ILLUMINATED, SOLID STATE DETECTOR...
- Publication number 20220399220
- Publication date Dec 15, 2022
- KLA Corporation
- John Gerling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING APPARATUS HAVING A PLURALITY OF MOVABLE BEAM COLUMNS, AND M...
- Publication number 20160064185
- Publication date Mar 3, 2016
- Keysight Technologies, Inc.
- Kurt Stephen Werder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE ENERGY-DISPERSIVE SPECTROSCOPY USING A LOW-VOLTAGE SCA...
- Publication number 20150213995
- Publication date Jul 30, 2015
- Keysight Technologies, Inc.
- Lawrence P. Muray
- G01 - MEASURING TESTING
Information Patent Application
LAYERED SCANNING CHARGED PARTICLE APPARATUS PACKAGE HAVING AN EMBED...
- Publication number 20100224778
- Publication date Sep 9, 2010
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYERED SCANNING CHARGED PARTICLE MICROSCOPE WITH DIFFERENTIAL PUMP...
- Publication number 20100224777
- Publication date Sep 9, 2010
- James P. Spallas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYERED SCANNING CHARGED PARTICLE MICROSCOPE PACKAGE FOR A CHARGED...
- Publication number 20100224779
- Publication date Sep 9, 2010
- Scott W. Indermuehle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED DEFLECTORS FOR BEAM ALIGNMENT AND BLANKING IN CHARGED PA...
- Publication number 20080217531
- Publication date Sep 11, 2008
- Lawrence P. Muray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD OF DETECTING SECONDARY ELECTRONS
- Publication number 20080054180
- Publication date Mar 6, 2008
- Charles Silver
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS structure with mechanical overdeflection limiter
- Publication number 20040001263
- Publication date Jan 1, 2004
- GlimmerGlass Networks, Inc.
- Bryan P. Staker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Silicon on insulator standoff and method for manufacture thereof
- Publication number 20030197176
- Publication date Oct 23, 2003
- GlimmerGlass Networks, Inc.
- James P. Spallas
- B81 - MICRO-STRUCTURAL TECHNOLOGY

James P. Spallas

Person

Patents Grantslast 30 patents

Segmented multi-channel, backside illuminated, solid state detector...

Imaging apparatus having a plurality of movable beam columns, and m...

High-voltage energy-dispersive spectroscopy using a low-voltage sca...

Layered scanning charged particle apparatus package having an embed...

Layered scanning charged particle microscope package for a charged...

Layered scanning charged particle microscope with differential pump...

Integrated deflectors for beam alignment and blanking in charged pa...

Stacked lens structure and method of use thereof for preventing ele...

System and method for multiple electron, ion, and photon beam align...

Methods for fabricating redeposition free thin film CPP read sensors

Layered electron beam column and method of use thereof

Stacked lens structure and method of use thereof for preventing ele...

Structure and method for redeposition free thin film CPP read senso...

MEMS structure with mechanical overdeflection limiter

Thin film read head structure with improved bias magnet-to-magnetor...

Parallel plate electron multiplier

MEMS structure with mechanical overdeflection limiter

High precision flexure stage

Thin film read head structure with improved bias magnet-to-magnetor...

Structure and method for redeposition free thin film CPP read senso...

Thin film read head structure with improved bias magnet-to-magnetor...

Silicon tip field emission cathodes

Silicon tip field emission cathode arrays and fabrication thereof

Patents Applicationslast 30 patents

MINIATURE HYBRID ELECTRON BEAM COLUMN

SEGMENTED MULTI-CHANNEL, BACKSIDE ILLUMINATED, SOLID STATE DETECTOR...

IMAGING APPARATUS HAVING A PLURALITY OF MOVABLE BEAM COLUMNS, AND M...

HIGH-VOLTAGE ENERGY-DISPERSIVE SPECTROSCOPY USING A LOW-VOLTAGE SCA...

LAYERED SCANNING CHARGED PARTICLE APPARATUS PACKAGE HAVING AN EMBED...

LAYERED SCANNING CHARGED PARTICLE MICROSCOPE WITH DIFFERENTIAL PUMP...

LAYERED SCANNING CHARGED PARTICLE MICROSCOPE PACKAGE FOR A CHARGED...

INTEGRATED DEFLECTORS FOR BEAM ALIGNMENT AND BLANKING IN CHARGED PA...

APPARATUS AND METHOD OF DETECTING SECONDARY ELECTRONS

MEMS structure with mechanical overdeflection limiter

Silicon on insulator standoff and method for manufacture thereof